Single shot 3D profilometry by polarization pattern projection

被引：6
|
作者：
Maeda, Yuuki [1 ]
Shibata, Shuhei [1 ]
Hagen, Nathan [1 ]
Otani, Yukitoshi [1 ]
机构：
[1] Utsunomiya Univ, Ctr Opt Res & Educ, 7-1-2 Yoto, Utsunomiya, Tochigi 3218585, Japan
来源：
APPLIED OPTICS | 2020年 / 59卷 / 06期
关键词：
LIGHT;
D O I：
10.1364/AO.382690
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We demonstrate a uniaxial 3D profilometry system illuminating the sample with a linear polarization pattern and measuring a polarization camera. The linear polarization pattern is generated by a spatial light modulator and a quarter-wave plate in the optical system. The system can measure four different fringe patterns with a phase difference of 90 deg simultaneously in the polarization camera. Therefore, we can measure three-dimensional shapes in a single shot. We present the measurement principles of the system and show the results of a real-time 3D profilometry experiment. (C) 2020 Optical Society of America
引用
收藏
页码：1654 / 1659
页数：6
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