Single shot 3D profilometry by polarization pattern projection

被引：6

作者：

Maeda, Yuuki ^{[1
]}

Shibata, Shuhei ^{[1
]}

Hagen, Nathan ^{[1
]}

Otani, Yukitoshi ^{[1
]}

机构：

[1] Utsunomiya Univ, Ctr Opt Res & Educ, 7-1-2 Yoto, Utsunomiya, Tochigi 3218585, Japan

来源：

APPLIED OPTICS | 2020年 / 59卷 / 06期

关键词：

LIGHT;

D O I：

10.1364/AO.382690

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We demonstrate a uniaxial 3D profilometry system illuminating the sample with a linear polarization pattern and measuring a polarization camera. The linear polarization pattern is generated by a spatial light modulator and a quarter-wave plate in the optical system. The system can measure four different fringe patterns with a phase difference of 90 deg simultaneously in the polarization camera. Therefore, we can measure three-dimensional shapes in a single shot. We present the measurement principles of the system and show the results of a real-time 3D profilometry experiment. (C) 2020 Optical Society of America

引用

页码：1654 / 1659

页数：6

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