Transient slider-disk contacts in the presence of spherical contamination particles

被引：3

作者：

Ovcharenko, A. ^{[1
,2
]}

Yang, M. ^{[1
]}

Chun, K. ^{[1
]}

Talke, F. E. ^{[2
]}

机构：

[1] Western Digital Corp, San Jose, CA 95138 USA

[2] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA

来源：

MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 2011年 / 17卷 / 5-7期

关键词：

MAGNETIC ERASURE; DAMAGE; SIMULATION; MEDIA;

D O I：

10.1007/s00542-010-1217-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Transient thermal-mechanical contacts between a slider and a rotating disk in the presence of contamination particles are investigated using finite element analysis. The maximum temperature rise due to frictional heating, the maximum plastically deformed area, and the maximum residual penetration into the disk surface are determined as a function of particle properties for aluminum and glass disk substrate. It is found that contact with soft and deformable particles can cause a large temperature rise, sufficient for thermal erasure, even though physical damage of the media is not observed. Contact with hard and rigid particles can lead to severe plastic deformation as well as high temperature rise of the media, representing the worst case for tribological integrity of the slider-disk interface.

引用

页码：743 / 747

页数：5

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