X-ray photoelectron spectroscopic studies of sellinite and eulytite BGO and BSO crystals

被引：8
作者：
Gopalakrishnan, R
Gopinath, CS
Ramasamy, P
机构：
[1] INDIAN INST TECHNOL, REG SOPHISTICATED INSTRUMENTAT CTR, MADRAS 600036, TAMIL NADU, INDIA
[2] ALAGAPPA UNIV, CRYSTAL RES CTR, KARAIKKUDI 623003, TAMIL NADU, INDIA
来源：
CRYSTAL RESEARCH AND TECHNOLOGY | 1996年 / 31卷 / 02期
关键词：
D O I：
10.1002/crat.2170310221
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
Single crystals of Bi12GeO20, Bi12SiO20, Bi4Ge3O12; and Bi4Si3O12 are grown by Floating zone and Czochralski techniques. The X-ray photoelectron spectroscopic (XPS) studies have been carried out on BSO and EGO crystals. XPS is employed to characterise the surface quality and bulk nature of the crystals. The surface contamination on both types of crystals are identified. In addition to the contamination, some amount of Bi atoms are observed with Bi ions on sellinite. It is demonstrated that the eulytite crystals are chemically more robust to degradation than the sellinite crystals. The predominant covalent and ionic character of Bi4Ge3O12 and Bi4Si3O12 respectively is explained from their oxygen 1s core level spectra.
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页码：249 / 254
页数：6
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