Dislocations in Bi0.4Ca0.6MnO3 epitaxial film grown on (110) SrTiO3 substrate

被引：2

作者：

Ding, Y. H. ^{[1
]}

Cai, R. S. ^{[1
]}

Wang, Y. Q. ^{[1
]}

Chen, Y. Z. ^{[2
,3
]}

Sun, J. R. ^{[2
,3
]}

机构：

[1] Qingdao Univ, Cultivat Base State Key Lab, Qingdao 266071, Peoples R China

[2] Chinese Acad Sci, State Key Lab Magnetism, Beijing 100080, Peoples R China

[3] Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Inst Phys, Beijing 100080, Peoples R China

来源：

MATERIALS LETTERS | 2012年 / 67卷 / 01期

基金：

中国国家自然科学基金;

关键词：

Thin film; Epitaxial growth; Electron microscopy; Defects;

D O I：

10.1016/j.matlet.2011.09.026

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Bi0.4Ca0.6MnO3 (BCMO) film with a thickness of 110 nm was epitaxially grown on a (110) SrTiO3 (STO) substrate using pulsed laser ablation technique. The microstructure of the epitaxial films was investigated by transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) in details. Two different kinds of dislocations, one being perpendicular to the BCMO/STO interface, the other being parallel to the interface, have been commonly observed. The formation mechanism for these dislocations has been discussed. All the dislocations are thought to relieve the local strain in the epitaxial film. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：67 / 69

页数：3

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