Study of Structure, Microstructure and Electrical Properties of La0.8Na0.2MnO3 in Bulk and Thin Film

被引：0

作者：

Ng, S. W. ^{[1
]}

Lim, K. P. ^{[1
]}

Halim, S. A. ^{[1
]}

Chen, S. K. ^{[1
]}

Wong, J. K. ^{[1
]}

Gan, H. M. Albert ^{[1
]}

机构：

[1] Univ Putra Malaysia, Dept Phys, Fac Sci, Upm Serdang 43300, Selangor, Malaysia

来源：

MALAYSIA ANNUAL PHYSICS CONFERENCE 2010 (PERFIK-2010) | 2011年 / 1328卷

关键词：

polycrystalline; manganites oxide; thin film; colossal magnetoresistance; pulsed laser deposition; MANGANITES;

D O I：

10.1063/1.3573744

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this study, polycrystalline of La(0.8)Na(0.2)MnO(3) bulk and thin films deposited on MgO (100) and coming 7059 glass have been prepared via solid-state and pulsed laser deposition method (PLD), respectively. From the Rietveld analysis, all samples are in trigonal crystal structure with space group of R-3C (167). Bulk and thin films showed different microstructure and structure, where thin film have relatively much smaller average grain size as compare bulk sample and the lattice parameter differ when deposited in different types of substrate. Bulk exhibits a metal insulator transition temperature (T(p)) at 228K. However, the T(p) of thin film on MgO (100) and corning 7059 glass samples shifted to higher value of 244K and 252K, respectively. The resistance for film is relatively higher due to its smaller crystalline size and hence increased its magnetically disordered state at the surface of grains. Hence, structure and electric property of the film is affected by the type of substrate used.

引用

页码：248 / 250

页数：3

共 7 条

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