Characterizing the impact of substrate noise on high-speed flash ADCs

被引:2
作者
Nikaeen, Parastoo [1 ]
Murmann, Boris [1 ]
Dutton, Robert W. [1 ]
机构
[1] Stanford Univ, Ctr Integrated Syst, Stanford, CA 94305 USA
来源
ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN | 2008年
关键词
D O I
10.1109/ISQED.2008.141
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 4-bit flash ADC is investigated in presence of substrate noise generated by switching activities in digital blocks. The impact of noise is analyzed in different building blocks of the ADC and is measured experimentally using a high-speed ADC test block fabricated in a 0.18-mu m SiGe BiCMOS process. Measurement results show that noise spikes in the substrate cause distortion in the prototype ADC and degrade its SNDR by 2 dB (10%) at noise frequencies above 200 MHz.
引用
收藏
页码:396 / 400
页数:5
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