IN-SITU XRD INVESTIGATION ON PHASE TRANSITION OF CdTe THIN FILMS DURING A CdCl2 HEAT TREATMENT

被引：0

作者：

Kim, MaengJun ^{[1
]}

Lee, SungHo ^{[2
]}

Sohn, SangHo ^{[1
]}

机构：

[1] Kyungpook Natl Univ, Dept Phys, Daegu, South Korea

[2] Nanopract Appl Ctr, Nanofus Res Team, Daegu, South Korea

来源：

35TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE | 2010年

基金：

新加坡国家研究基金会;

关键词：

RECRYSTALLIZATION;

D O I：

暂无

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

In order to investigate the effect of CdCl2 heat treatment on the physical properties of the CdTe thin films grown by a sputtering method, the CdTe thin films were coated with CdCl2. The recrystallisation, grain growth and randomization were investigated by monitoring the phase transition of CdCl2 heat treated CdTe specimens during temperature ramp annealed using in situ high-temperature X-ray diffraction. The result shows that the recrystallisation of the CdTe(111) texture and other textures does not occur simultaneously but sequencially. The XRD data shows there was no overlapped temperature region for recrystallisation between (111) and other textures.

引用

页数：1

共 14 条

[1]

D H, 1996, MAT RES SOC P, V426, P426

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