31GHz Ge n-i-p waveguide photodetectors on Silicon-on-Insulator substrate

被引:335
作者
Yin, Tao
Cohen, Rami
Morse, Mike M.
Sarid, Gadi
Chetrit, Yoel
Rubin, Doron
Paniccia, Mario J.
机构
[1] Intel Corp, Santa Clara, CA 95054 USA
[2] Intel Corp, IL-91031 Jerusalem, Israel
关键词
D O I
10.1364/OE.15.013965
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report on evanescently coupled Ge waveguide photodetectors that are grown on top of Si rib waveguides. A Ge waveguide detector with a width of 7.4.mu m and length of 50 mu m demonstrated an optical bandwidth of 31.3 GHz at - 2V for 1550nm. In addition, a responsivity of 0.89 A/W at 1550 nm and dark current of 169 nA were measured from this detector at - 2V. A higher responsivity of 1.16 A/W was also measured from a longer Ge waveguide detector ( 4.4 x 100 mu m(2)), with a corresponding bandwidth of 29.4 GHz at - 2V. An open eye diagram at 40 Gb/s is also shown. (c) 2007 Optical Society of America.
引用
收藏
页码:13965 / 13971
页数:7
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