Investigation of inhomogeneity of BaTiO3 thin films using transmittance spectra measurements

被引:10
作者
Nenkov, M
Pencheva, T
机构
[1] Department of Physics, Russe University, 8 Studentska St.
关键词
refractive index; films; inhomogeneity;
D O I
10.1016/S0040-6090(98)00373-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The investigation deals with determination of thin film refractive index depth profile (inhomogeneity) using the film interference transmittance spectrum only. Barium titanate films deposited at different conditions are studied and a new approach for investigation of the film inhomogeneity is proposed. It is based on transmittance spectra fitting using numerical optimisation methods. Two models for the refractive index variations in the film (linear and non-linear) together with a homogeneous layer model are used to describe the films. The best fit between measurements and calculations is found for the model using quadratic variations of the refractive index in the film. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:305 / 310
页数:6
相关论文
共 26 条
[1]  
Bazaraa MokhtarS., 1979, Nonlinear Programming: Theory and Algorithms
[2]   AUTOMATIC-DETERMINATION OF THE OPTICAL-CONSTANTS OF INHOMOGENEOUS THIN-FILMS [J].
BORGOGNO, JP ;
LAZARIDES, B ;
PELLETIER, E .
APPLIED OPTICS, 1982, 21 (22) :4020-4029
[3]  
BORGONGO JP, 1984, APPL OPTICS, V21, P3567
[4]  
BORN M, 1983, PRINCIPLES OPTICS
[5]   OPTICAL-CONSTANT CALCULATION OVER AN EXTENDED SPECTRAL REGION - APPLICATION TO TITANIUM-DIOXIDE FILM [J].
CHIAO, SC ;
BOVARD, BG ;
MACLEOD, HA .
APPLIED OPTICS, 1995, 34 (31) :7355-7360
[6]   DETERMINATION OF THE OPTICAL-CONSTANTS OF AN INHOMOGENEOUS TRANSPARENT LAF3 THIN-FILM ON A TRANSPARENT SUBSTRATE BY SPECTROSCOPIC ELLIPSOMETRY [J].
CHINDAUDOM, P ;
VEDAM, K .
OPTICS LETTERS, 1992, 17 (07) :538-541
[7]   CHARACTERIZATION OF INHOMOGENEOUS TRANSPARENT THIN-FILMS ON TRANSPARENT SUBSTRATES BY SPECTROSCOPIC ELLIPSOMETRY - REFRACTIVE-INDEXES N(LAMBDA) OF SOME FLUORIDE COATING MATERIALS [J].
CHINDAUDOM, P ;
VEDAM, K .
APPLIED OPTICS, 1994, 33 (13) :2664-2671
[8]   AES STUDY ON THE CHEMICAL-COMPOSITION OF FERROELECTRIC BATIO3 THIN-FILMS RF SPUTTER-DEPOSITED ON SILICON [J].
DHARMADHIKARI, VS ;
GRANNEMANN, WW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02) :483-485
[9]   DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS BASED ON INVERSE SYNTHESIS [J].
DOBROWOLSKI, JA ;
HO, FC ;
WALDORF, A .
APPLIED OPTICS, 1983, 22 (20) :3191-3200
[10]   SIMULTANEOUS DETERMINATION OF DISPERSION-RELATION AND DEPTH PROFILE OF THORIUM FLUORIDE THIN-FILM BY SPECTROSCOPIC ELLIPSOMETRY [J].
KIM, SY ;
VEDAM, K .
THIN SOLID FILMS, 1988, 166 (1-2) :325-334