Ti:Pt:Au:Ni thin-film CVD diamond sensor ability for charged particle detection

被引:1
作者
Kasiwattanawut, Haruetai [1 ]
Tchouaso, Modeste Tchakoua [1 ]
Prelas, Mark A. [1 ,2 ]
机构
[1] Univ Missouri, Nucl Sci & Engn Inst, Columbia, MO 65211 USA
[2] Univ Missouri, Elect Engn & Comp Sci, Columbia, MO 65211 USA
关键词
CVD diamond; Charged particles; Energy range; Energy resolution; Ni-H LENR System; X-RAY-DETECTION; DEVICES;
D O I
10.1016/j.apradiso.2018.05.012
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
This work demonstrates the development of diamond sensors with reliable contacts using a new metallization formula, which can operate under high-pressure gas environment. The metallization was created using thin film layers of titanium, platinum, gold and nickel deposited on a single crystal electronic grade CVD diamond chip. The contacts were 2 nm in diameter with thickness of 50/5/20/150 nm of Ti:Pt:Au:Ni. The optimum operating voltage of the sensor was determined from the current-voltage measurements. The sensor was calibrated with (PU)-P-239 and Am-241 alpha radiation sources at 300 V. The energy resolution of the Ti:Pt:Au:Ni diamond sensor was determined to be 7.6% at 5.2 MeV of (PU)-P-239 and 2.2% at 5.48 MeV of Am-241. The high-pressure gas loading environment under which this sensor was used is discussed. Specifically, experimental observations are described using hydrogen loading of nickel as a means of initiating low energy nuclear reactions. No neutrons, electrons, ions or other ionizing radiations were observed in these experiments.
引用
收藏
页码:181 / 186
页数:6
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