High-frequency characteristics of a quantum well diode

被引:0
|
作者
Ershov, M
Ryzhii, V
Saito, K
机构
来源
ICSE '96 - 1996 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS | 1996年
关键词
D O I
10.1109/SMELEC.1996.616473
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High-frequency characteristics of a quantum well (QW) diode with thermionic electron transport are reported in this paper. The frequency-dependent admittance of the QW diode is obtained in an analytical using the rigorous self-consistent small-signal analysis. The frequency dependencies of the QW diode capacitance and conductance are governed by a characteristic time of the recharging of the QW, which depends strongly on temperature and device structural parameters. Experimental data on conductance and capacitance of the QW diode as functions of temperature and frequency can be used to extract the parameters of the QW, such as QW recombination velocity and ionization energy.
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页码:154 / 157
页数:4
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