Transparent conducting n-type ZnO: Sc - synthesis, optoelectronic properties and theoretical insight

被引:55
作者
Dixon, Sebastian C. [1 ]
Sathasivam, Sanjayan [1 ]
Williamson, Benjamin A. D. [2 ]
Scanlon, David O. [2 ,3 ]
Carmalt, Claire J. [1 ]
Parkin, Ivan P. [1 ]
机构
[1] UCL, Dept Chem, Mat Chem Ctr, 20 Gordon St, London WC1H 0AJ, England
[2] UCL, Dept Chem, Kathleen Lonsdale Mat Chem, 20 Gordon St, London WC1H 0AJ, England
[3] Diamond Light Source Ltd, Diamond House,Harwell Sci & Innovat Campus, Didcot OX11 0DE, Oxon, England
基金
英国工程与自然科学研究理事会;
关键词
TOTAL-ENERGY CALCULATIONS; ZINC-OXIDE FILMS; DOPED ZNO; THIN-FILMS; BAND-GAP; ELECTRICAL-PROPERTIES; HIGHLY TRANSPARENT; HIGH-MOBILITY; AL-SC; DEFECTS;
D O I
10.1039/c7tc02389h
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A joint theoretical-experimental study has been carried out for Sc-doped ZnO (SZO), one of the lesser-studied n-type transparent conducting oxide materials. Density functional theory has been used to create a computational model of SZO, in order to provide a theoretical basis for experimentally-observed phenomena where growth conditions, dopability and electronic properties are concerned. Meanwhile a range of thin films of SZO have been synthesised via chemical vapour deposition in an attempt to (i) observe experimentally the theoretically predicted properties, thereby providing mutual validation of the studies; (ii) seek the optimum dopant quantity for minimal electrical resistivity, and; (iii) demonstrate that transparent and electrically conductive SZO can be synthesised by chemical vapour deposition means. The films exhibit resistivities as low as p = 1.2 x 10(-3) Omega cm, with carrier density n = 7.2 x 10(20) cm(-3) and charge carrier mobility mu = 7.5 cm(2) V-1 s(-1). Low resistivity of the films was retained after 12 months in storage under ambient conditions, indicating strong atmospheric stability. The films exhibit a high degree of transparency with 88% transmission in the visible range ( 400-750 nm). A correction to the Tauc method was applied to estimate band gaps of E-g(opt) = 3.45 +/- 0.03 eV in the most conductive SZO sample and E-g(opt) = 3.34 +/- 0.03 eV in nominally undoped ZnO.
引用
收藏
页码:7585 / 7597
页数:13
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