The influence of thickness on the Kondo effect in Cu(Fe) thin films

被引：6
作者：
Apostolopoulos, G
Papastaikoudis, C
机构：
[1] Institute for Material Science, Natl. Ctr. for Sci. Res. Demokritos, Athens, Attiki
来源：
SOLID STATE COMMUNICATIONS | 1996年 / 99卷 / 04期
关键词：
thin films; Kondo effect;
D O I：
10.1016/0038-1098(96)00211-6
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The resistivity of thin films of the Cu(Fe) system (c = 130 ppm Fe) has been measured as a function of thickness in the temperature ranges between 1.6 and 30 K. The measurements have shown that the slope of the logarithmic temperature dependence decreases with decreasing thickness below 7 mu m. This behavior is attributed to the influence of the film thickness on the conduction electron-spin screening cloud which forms around the magnetic impurities. Copyright (C) 1996 Elsevier Science Ltd
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页码：277 / 281
页数：5
相关论文
共 26 条
[11]   NEW SOLUTION FOR EXCHANGE SCATTERING IN DILUTE ALLOYS [J].
HAMANN, DR .
PHYSICAL REVIEW, 1967, 158 (03) :570-&
[12]   SPIN CORRELATION IN DILUTE MAGNETIC ALLOYS [J].
ISHII, H .
JOURNAL OF LOW TEMPERATURE PHYSICS, 1978, 32 (3-4) :457-467
[13]   SPIN POLARIZATION IN ANDERSON MODEL [J].
ISHII, H .
PROGRESS OF THEORETICAL PHYSICS, 1976, 55 (05) :1373-1383
[14]  
KITTEL C, 1966, INTRO SOLID STATE PH, P208
[15]   RESISTANCE MINIMUM IN DILUTE MAGNETIC ALLOYS [J].
KONDO, J .
PROGRESS OF THEORETICAL PHYSICS, 1964, 32 (01) :37-+
[16]   POSITIVE AND NEGATIVE SURFACE INDUCED DEVIATIONS FROM MATTHIESSEN RULE IN THIN COPPER WIRES [J].
KUCKHERMANN, V ;
KAPPEL, A ;
MENDE, HH .
SOLID STATE COMMUNICATIONS, 1986, 60 (03) :231-234
[17]  
LORAM JW, 1968, PHYS REV B, V2, P857
[18]   SPIN CORRELATION IN DILUTE MAGNETIC ALLOYS [J].
MULLERHARTMANN, E .
ZEITSCHRIFT FUR PHYSIK, 1969, 223 (03) :277-+
[19]  
NOZIERES P, 1975, 14TH P INT C LOW TEM, V5, P339
[20]   THE KONDO SYSTEM CUFE - COMPARISON OF THEORY AND EXPERIMENT [J].
SACRAMENTO, PD ;
SCHLOTTMANN, P .
SOLID STATE COMMUNICATIONS, 1990, 73 (11) :747-750
123