Optical Fault Attacks on AES: A Threat in Violet

被引:0
作者
Schmidt, Joern-Marc [1 ]
Hutter, Michael [1 ]
Plos, Thomas [1 ]
机构
[1] Graz Univ Technol, Inst Appl Informat Proc & Commun, A-8010 Graz, Austria
来源
2009 WORKSHOP ON FAULT DIAGNOSIS AND TOLERANCE IN CRYPTOGRAPHY (FDTC 2009) | 2009年
关键词
Fault Analysis; Ultraviolet Light; UV-C; Implementation Attacks; AES;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Microprocessors are the heart of the devices we rely on every day. However, their non-volatile memory, which often contains sensitive information, can be manipulated by ultraviolet (UV) irradiation. This paper gives practical results demonstrating that the non-volatile memory can be erased with. UV light by investigating the effects of UV-C light with a wavelength of 254 nm on four different depackaged microcontrollers. We demonstrate that an adversary can use this effect to attack an AES software implementation by manipulating the 256-bit S-box table. We show that if only a single byte of the table is changed, 2 500 pairs of correct and faulty encrypted inputs are sufficient to recover the key with a probability of 90%, in case the key schedule is not modified by the attack. Furthermore, we emphasize this by presenting a practical attack on an AES implementation running on an 8-bit microcontroller Our attack involves only a standard decapsulation procedure and the use of a low-cost,UV lamp.
引用
收藏
页码:13 / 22
页数:10
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