Improving ALD growth rate via ligand basicity: Quantum chemical calculations on lanthanum precursors

被引:26
作者
Elliott, Simon D. [1 ]
机构
[1] Univ Ireland Univ Coll Cork, Tyndall Natl Inst, Lee Maltings, Cork, Ireland
关键词
lanthanum oxide; atomic layer deposition; density functional theory; high-k dielectrics;
D O I
10.1016/j.surfcoat.2007.04.116
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
At the atomic scale, the success of atomic layer deposition (ALD) depends on the efficient elimination of precursor ligands from the surface of the growing film. For the ALD of high-k lanthanum, oxide films, we consider alkoxide, cyclopentadienyl, beta-diketonate and amide precursors, and use density functional theory to compute their reactivity with respect to ligand elimination during ALD with water vapour. The energetic data are correlated with electronic properties and steric demand, allowing recommendations for precursor design to be made. Ligands that are weaker Lewis bases than Bronsted bases are shown to be more successful as components of ALD precursors. (C) 2007 Elsevier B.V All rights reserved.
引用
收藏
页码:9076 / 9081
页数:6
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