Analysis of the Laser Damage Characteristics of a Production Lot

被引：46

作者：

Arenberg, Jonathan W. ^{[1
]}

Jensen, Lars O. ^{[2
]}

Ristau, Detlev ^{[2
]}

机构：

[1] Northrop Grumman Aerosp Syst, One Space Pk Dr, Redondo Beach, CA 90278 USA

[2] Laser Zentrum Hannover, Hannover, Germany

来源：

LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2014 | 2014年 / 9237卷

关键词：

damage frequency method; binary search technique; maximum likelihood; lot testing;

D O I：

10.1117/12.2068336

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper reports on the analysis of laser damage measurements made on an entire lot of approximately identically processed and coated samples. Each sample's test data is analyzed to determine its probability of damage curve, p(i)(phi). The probability of damage curves are further processed to derive the defect distribution, f(i)(phi), for each sample. The individual f(i)(phi) are then examined to determine if they are likely to have come from a single parent distribution, f(phi), which represents the performance of the manufacturing process

引用

页数：7

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