Surface Profiling and Characterization of Microlenses Utilizing a Shack-Hartmann Wavefront Sensor

被引：0
作者：
Li, Chenhui [1 ]
Hall, Gunnsteinn [1 ]
Aldalali, Bader [1 ]
Zhu, Difeng [1 ]
Eliceiri, Kevin [1 ]
Jiang, Hongrui [1 ]
机构：
[1] Univ Wisconsin, Madison, WI 53706 USA
来源：
OMN2011: 16TH INTERNATIONAL CONFERENCE ON OPTICAL MEMS AND NANOPHOTONICS | 2011年
关键词：
three-dimensional; surface profile; Shack-Hartmann wavefront sensor; liquid microlens;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We report on the characterization of microlenses utilizing the three-dimensional (3D) surface profile obtained from a Shack-Hartmann wavefront sensor. This method can be applied to most types of microlenses, especially liquid ones. Both a solid and a liquid microlens were characterized. The surface data was analyzed and then exported into Zemax to compute their optical properties. The wavefront error of the liquid lens tested increased from 0.44 to 2.41 waves as its focal length was tuned from 10.1 to 4.3 mm. The surface profiles can also be used to study the effect of gravity on microlenses and surface wetting for optimizing the lens fabrication procedure.
引用
收藏
页码：185 / 186
页数：2
相关论文
共 50 条
  • [21] Algorithm for extending dynamic range of Shack-Hartmann wavefront sensor
    Zhang J.
    Zhang Z.
    Zhang X.
    Li R.
    Guangxue Xuebao/Acta Optica Sinica, 2011, 31 (08):
  • [22] Measurement of lens parameters based on Shack-Hartmann wavefront sensor
    Deng, Zijin
    Li, Changwei
    Zhang, Sijiong
    OPTICS AND LASERS IN ENGINEERING, 2025, 184
  • [23] Shack-Hartmann wavefront sensor using IR extended source
    Robert, Clelia
    Fleury, Bruno
    Michau, Vincent
    Conan, Jean-Marc
    Veyssiere, Luc
    Magli, Serge
    Vial, Laurent
    OPTICS IN ATMOSPHERIC PROPAGATION AND ADAPTIVE SYSTEMS X, 2007, 6747
  • [24] Accuracy characterization of Shack-Hartmann sensor with residual error removal in spherical wavefront calibration
    He, Yi
    Bao, Mingdi
    Chen, Yiwei
    Ye, Hong
    Fan, Jinyu
    Shi, Guohua
    LIGHT-ADVANCED MANUFACTURING, 2023, 4 (04):
  • [25] Measurement error for a Shack-Hartmann wavefront sensor in strong scintillation conditions
    Plett, ML
    Barbier, PR
    Rush, DW
    Polak-Dingels, P
    Levine, BM
    PROPAGATION AND IMAGING THROUGH THE ATMOSPHERE II, 1998, 3433 : 211 - 220
  • [26] High-precision spherical wavefront calibration method for shack-hartmann wavefront sensor
    Bao, Ming-di
    Shi, Guo-hua
    Xing, Li-na
    He, Yi
    CHINESE OPTICS, 2024, 17 (03)
  • [27] Expanded Scene Image Preprocessing Method for the Shack-Hartmann Wavefront Sensor
    Chen, Bo
    Jia, Jingjing
    Zhou, Yilin
    Zhang, Yirui
    Li, Zhaoyi
    APPLIED SCIENCES-BASEL, 2023, 13 (18):
  • [28] Analysis of the wavefront reconstruction error of the spot location algorithms for the Shack-Hartmann wavefront sensor
    Wei, Ping
    Li, Xinyang
    Luo, Xi
    Li, Jianfeng
    OPTICAL ENGINEERING, 2020, 59 (04)
  • [29] Influence of Lack of Light in Partial Subapertures on Wavefront Reconstruction for Shack-Hartmann Wavefront Sensor
    We Ping
    Li Xinyang
    Luo Xi
    Li Jianfeng
    CHINESE JOURNAL OF LASERS-ZHONGGUO JIGUANG, 2020, 47 (04):
  • [30] Effect of ambient temperature on the measurement accuracy of Shack-Hartmann wavefront sensor
    Meng Qingbin
    Qi Yuejing
    Lu Zengxiong
    Su Jiani
    2015 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: ADVANCED LASERS AND APPLICATIONS, 2015, 9621
12345