Structural characterization and optical properties of annealed Sb2S3 thin films

被引：0
|
作者：
Tigau, Nicolae [1 ]
机构：
[1] Dunarea de Jos Univ Galati, Fac Sci, Galati 800201, Romania
来源：
ROMANIAN JOURNAL OF PHYSICS | 2008年 / 53卷 / 1-2期
关键词：
antimony trisulfide; thin films; structural properties; optical band gap;
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The influence of thermal annealing on the structure and optical properties of antimony trisulfide (Sb2S3) thin films deposited by thermal evaporation under vacuum onto glass substrate was studied. The structural investigation performed by means of X-ray diffraction (XRD) and atomic force microscopy (AFM) showed that the ad-deposited films have an amorphous structure. After thermal annealing at temperature of 500 K the Sb2S3 thin films becomes polycrystalline in structure. The values of some important parameters of studied films as absorption coefficient and optical band gap energy are determined from transmission spectra. The indirect optical band gap of amorphous film was found to be 1.53 eV and the direct optical band gap of polycrystalline film was found to be 1.71 eV.
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收藏
页码：209 / +
页数：9
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