Optical and electrical properties of p-type AgInSnxS2-x (x=0-0.04) thin films prepared by spray pyrolysis

被引:9
作者
Albor-Aguilera, ML
Cayente-Romero, JJ
Peza-Tapia, JM
De León-Gutiérrez, LR
Ortega-López, M
机构
[1] IPN, Depto Ingn Elect SEES, CINVESTAV, Mexico City 07360, DF, Mexico
[2] IPN, ESFM, UPALM, Mexico City 07738, DF, Mexico
关键词
AgInSnxS2-x; thin films; optical and electrical properties;
D O I
10.1016/j.tsf.2005.04.050
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
AgInSRxS2-x (x=0-0.2) polycrystalline thin films were prepared by the spray pyrolysis technique. The samples were deposited on glass substrates at temperatures of 375 and 400 degrees C from alcoholic solutions comprising silver acetate, indium chloride, thiourea and tin chloride. All deposited films crystallized in the chalcopyrite structure of AgInS2. A p-type conductivity was detected in the Sn-doped samples deposited at 375 degrees C, otherwise they are n-type. The optical properties of AgInSnxS2-x (x < 0.2) resemble those of chalcopyrite AgInS2. Low-temperature PL measurements revealed that Sn occupying an S-site could be the responsible defect for the p-type conductivity observed in AgInSRxS2-x (x < 2) thin films. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:168 / 172
页数:5
相关论文
共 12 条
[11]   Growth and characterization of p-type AgInS2 crystals [J].
Yoshino, K ;
Komaki, H ;
Kakeno, T ;
Akaki, Y ;
Ikari, T .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2003, 64 (9-10) :1839-1842
[12]   Origin of point defects in AgInS2/GaAs epilayer obtained from photoluminescence measurement [J].
You, SH ;
Hong, KJ ;
Youn, CJ ;
Jeong, TS ;
Moon, JD ;
Kim, HS ;
Park, JS .
JOURNAL OF APPLIED PHYSICS, 2001, 90 (08) :3894-3898