Deposition of high transparent and hard optical coating by tetraethylorthosilicate plasma polymerization

被引:7
作者
Abbasi-Firouzjah, M. [1 ]
Shokri, B. [2 ,3 ]
机构
[1] Sabzevar Univ New Technol, Fac Engn, Sabzevar, Iran
[2] Shahid Beheshti Univ, Laser & Plasma Res Inst, GC, Tehran, Iran
[3] Shahid Beheshti Univ, Phys Dept, GC, Tehran, Iran
关键词
Fluorine-doped silicon oxide; Berkovich nanoindentaion; Hardness; Elastic modulus; Transparency; Longitudinal optical mode; CHEMICAL-VAPOR-DEPOSITION; LOW-K DIELECTRICS; REFRACTIVE-INDEX; CARBON-FILMS; THIN-FILMS; MECHANICAL-PROPERTIES; INFRARED-ABSORPTION; OXIDE-FILMS; H FILMS; SI;
D O I
10.1016/j.tsf.2020.137857
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This study aims at synthesizing highly transparent and hard fluorine doped silicon oxide films by tetraethylorthosilicate-oxygen-tetrafluoromethane plasma polymerization. The films were deposited by plasma enhanced chemical vapor deposition method at low temperature. Mechanical properties such as hardness, reduced elastic modulus and plasticity index were studied by nanoindentation analysis. Optical properties of the films such as transmittance, absorbance, reflectance, refractive index, and extinction coefficient were characterized by spectroscopic ellipsometry. Moreover, transparency of the films was studied by normal incidence ultraviolet-visible spectroscopy. It was found that the optical and mechanical properties of the deposited films were affected by changing carbon bonds in the films chemical structure such as C-2, CF2, and C2F2. It was also shown that decreasing the power applied could result in an increase in the carbon content of the fluorinated silicon oxide film without using additional carbon precursor, conditioned on using an organosilicon precursor and tetrafluoromethane. It can improve the mechanical properties of the film.
引用
收藏
页数:8
相关论文
共 51 条
[1]   Characteristics of ultra low-k nanoporous and fluorinated silica based films prepared by plasma enhanced chemical vapor deposition [J].
Abbasi-Firouzjah, M. ;
Shokri, B. .
JOURNAL OF APPLIED PHYSICS, 2013, 114 (21)
[2]   Characterization of fluorinated silica thin films with ultra-low refractive index deposited at low temperature [J].
Abbasi-Firouzjah, Marzieh ;
Shokri, Babak .
THIN SOLID FILMS, 2015, 577 :67-73
[3]   The effect of TEOS plasma parameters on the silicon dioxide deposition mechanisms [J].
Abbasi-Firouzjah, Marzieh ;
Hosseini, Seyed-Iman ;
Shariat, Mahdi ;
Shokri, Babak .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2013, 368 :86-92
[4]   On the contributions of the electronic polarizability and porosity to the reduction of the refractive index of SiOF films deposited by remote plasma-enhanced chemical vapor deposition [J].
Alonso, JC ;
Díaz-Bucio, XM ;
Pichardo, E ;
Rodríguez-Fernández, L ;
Ortiz, A .
THIN SOLID FILMS, 2005, 474 (1-2) :294-300
[5]  
[Anonymous], 2015, Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization
[6]   The properties of fluorine containing diamond-like carbon films prepared by plasma-enhanced chemical vapour deposition [J].
Bendavid, A. ;
Martin, P. J. ;
Randeniya, L. ;
Amin, M. S. .
DIAMOND AND RELATED MATERIALS, 2009, 18 (01) :66-71
[7]   INFRARED ABSORPTION AT LONGITUDINAL OPTIC FREQUENCY IN CUBIC CRYSTAL FILMS [J].
BERREMAN, DW .
PHYSICAL REVIEW, 1963, 130 (06) :2193-&
[8]   RF-PLASMA DEPOSITED AMORPHOUS HYDROGENATED HARD CARBON THIN-FILMS - PREPARATION, PROPERTIES, AND APPLICATIONS [J].
BUBENZER, A ;
DISCHLER, B ;
BRANDT, G ;
KOIDL, P .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (08) :4590-4595
[9]   UV curing effects on mechanical and electrical performances of a PECVD non-porogen porous SiOC:H films (in k [2.2-2.4] range) for 45 nm node and below [J].
Chapelon, L. L. ;
Vitiello, J. ;
Gonchond, J. P. ;
Barbier, D. ;
Torres, J. .
MICROELECTRONIC ENGINEERING, 2006, 83 (11-12) :2136-2141
[10]   Improving the mechanical property of amorphous carbon films by silicon doping [J].
Chaus, A. S. ;
Jiang, X. H. ;
Pokorny, P. ;
Piliptsou, D. G. ;
Rogachev, A. V. .
DIAMOND AND RELATED MATERIALS, 2018, 82 :137-142