Strain effects in low-dimensional transition metal oxides

被引:127
作者
Cao, Jinbo [1 ,2 ]
Wu, Junqiao [1 ,2 ]
机构
[1] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
基金
美国国家科学基金会;
关键词
Nanowire; Thin film; Strain; Transition metal oxide; Correlated electron material; Phase transition; FERROELECTRIC THIN-FILMS; CHEMICAL-VAPOR-DEPOSITION; SINGLE ZNO NANOWIRE; INSULATOR-TRANSITION; DIELECTRIC-PROPERTIES; PHASE-DIAGRAM; RAMAN-SPECTROSCOPY; COLOSSAL MAGNETORESISTANCE; STRONTIUM-TITANATE; DOMAIN-STRUCTURES;
D O I
10.1016/j.mser.2010.08.001
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Transition metal oxides offer a wide spectrum of properties which provide the foundation for a broad range of potential applications. Many of these properties originate from intrinsic coupling between lattice deformation and nanoscale electronic and magnetic ordering. Lattice strain thus has a profound influence on the electrical, optical, and magnetic properties of these materials. Recent advances in materials processing have led to the synthesis of low-dimensional single-crystal transition metal oxides, namely, epitaxial ultra-thin films and free-standing nano/microwires. Unlike bulk materials, these systems allow external tuning of uniform strain in these materials to tailor their properties and functionalities. This paper provides a comprehensive review of recent developments in studies of strain effects in transition metal oxide ultra-thin films and nano/microwires. In epitaxial thin films, biaxial strain is developed as a result of lattice mismatch between the film and the substrate. By choosing different substrates, a wide range of strain can be established at discrete values that allows for exploration of new phase space, enhancement of order parameters, creation of complicated domain textures, and stabilization of new phases. On the other hand, continuous tuning of uniaxial strain is possible in nano/microwires, where a variety of phase transitions and their dynamics could be probed at the single or few-domain scale. We focus on the work of strain-controlled electromechanical response in piezoelectric oxides and strain-induced metal-insulator transitions as well as domain physics in strongly correlated electron oxides. Related nanoscale device applications such as strain sensing and power generation will be highlighted as well. Published by Elsevier B.V.
引用
收藏
页码:35 / 52
页数:18
相关论文
共 205 条
  • [1] Effect of biaxial strain on the electrical and magnetic properties of (001) La0.7Sr0.3MnO3 thin films
    Adamo, C.
    Ke, X.
    Wang, H. Q.
    Xin, H. L.
    Heeg, T.
    Hawley, M. E.
    Zander, W.
    Schubert, J.
    Schiffer, P.
    Muller, D. A.
    Maritato, L.
    Schlom, D. G.
    [J]. APPLIED PHYSICS LETTERS, 2009, 95 (11)
  • [2] Strain-induced metal-insulator phase coexistence in perovskite manganites
    Ahn, KH
    Lookman, T
    Bishop, AR
    [J]. NATURE, 2004, 428 (6981) : 401 - 404
  • [3] Alexe M., 2004, Nanoscale Characterization of Ferroelectric Materials
  • [4] Can interface dislocations degrade ferroelectric properties?
    Alpay, SP
    Misirlioglu, IB
    Nagarajan, V
    Ramesh, R
    [J]. APPLIED PHYSICS LETTERS, 2004, 85 (11) : 2044 - 2046
  • [5] Suppression of the metal-insulator transition temperature in thin La0.7Sr0.3MnO3 films
    Angeloni, M
    Balestrino, G
    Boggio, NG
    Medaglia, PG
    Orgiani, P
    Tebano, A
    [J]. JOURNAL OF APPLIED PHYSICS, 2004, 96 (11) : 6387 - 6392
  • [6] [Anonymous], 2002, Nanoscale Phase Separation and Colossal Magnetoresistance: the physics of manganites and related compounds
  • [7] Phase diagrams and dielectric response of epitaxial barium strontium titanate films: A theoretical analysis
    Ban, ZG
    Alpay, SP
    [J]. JOURNAL OF APPLIED PHYSICS, 2002, 91 (11) : 9288 - 9296
  • [8] BERGLUND CN, 1969, PHYS REV, V185, P1022, DOI 10.1103/PhysRev.185.1022
  • [9] Influence of anisotropic strain on the dielectric and ferroelectric properties of SrTiO3 thin films on DyScO3 substrates
    Biegalski, M. D.
    Vlahos, E.
    Sheng, G.
    Li, Y. L.
    Bernhagen, M.
    Reiche, P.
    Uecker, R.
    Streiffer, S. K.
    Chen, L. Q.
    Gopalan, V.
    Schlom, D. G.
    Trolier-McKinstry, S.
    [J]. PHYSICAL REVIEW B, 2009, 79 (22):
  • [10] Critical thickness of high structural quality SrTiO3 films grown on orthorhombic (101) DyScO3
    Biegalski, M. D.
    Fong, D. D.
    Eastman, J. A.
    Fuoss, P. H.
    Streiffer, S. K.
    Heeg, T.
    Schubert, J.
    Tian, W.
    Nelson, C. T.
    Pan, X. Q.
    Hawley, M. E.
    Bernhagen, M.
    Reiche, P.
    Uecker, R.
    Trolier-McKinstry, S.
    Schlom, D. G.
    [J]. JOURNAL OF APPLIED PHYSICS, 2008, 104 (11)