Precision measurements of AC Josephson voltage standard operating margins

被引:28
作者
Burroughs, CJ [1 ]
Benz, SP [1 ]
Dresselhaus, PD [1 ]
Chong, Y [1 ]
机构
[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA
关键词
AC measurements; AC voltage standard; Josephson arrays; Josephson devices;
D O I
10.1109/TIM.2004.843070
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Recent advances in circuit design and fabrication of superconducting integrated circuits have enabled us to demonstrate an ac Josephson voltage standard (ACJVS) that generates both ac and dc waveforms up to 242-mV peak voltage. Using a Fast Fourier Transform spectrum analyzer and an ac-dc transfer standard, we characterize ACJVS operating margins by performing "flat-spot" measurements at the level of a part in 10(6) for all eight bias parameters. By verifying that every bias parameter has a "flat-spot" (i.e., a range of bias values over which the measured ACJVS output is precisely constant), we demonstrate that all Josephson junctions on the chip are operating properly.
引用
收藏
页码:624 / 627
页数:4
相关论文
共 8 条
[1]   AC coupling technique for Josephson waveform synthesis [J].
Benz, SP ;
Burroughs, CJ ;
Dresselhaus, PD .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2001, 11 (01) :612-616
[2]  
Benz SP, 2002, IEICE T ELECTRON, VE85C, P608
[3]   AC and DC voltages from a Josephson arbitrary waveform synthesizer [J].
Benz, SP ;
Burroughs, CJ ;
Dresselhaus, PD ;
Christian, LA .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2001, 50 (02) :181-184
[4]   AC Josephson voltage standard error measurements and analysis [J].
Burroughs, CJ ;
Benz, SP ;
Dresselhaus, PD .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2003, 52 (02) :542-544
[5]  
CANDY JC, 1997, DELTA SIGMA DATA CON
[6]   2.6-V high-resolution programmable josephson voltage standard circuits using double-stacked MOSi2-barrier junctions [J].
Chong, Y ;
Burroughs, CJ ;
Dresselhaus, PD ;
Hadacek, N ;
Yamamori, H ;
Benz, SP .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2005, 54 (02) :616-619
[7]   Effects of interlayer electrode thickness in Nb/(MoSi2/Nb)N stacked Josephson junctions [J].
Chong, Y ;
Dresselhaus, PD ;
Benz, SP ;
Bonevich, JE .
APPLIED PHYSICS LETTERS, 2003, 82 (15) :2467-2469
[8]   Stacked SNS Josephson junction arrays for quantum voltage standards [J].
Dresselhaus, PD ;
Chong, Y ;
Plantenberg, JH ;
Benz, SP .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2003, 13 (02) :930-933