Atom-by-atom analysis of non-metallic materials by the scanning atom probe

被引:0
作者
Nishikwa, O [1 ]
Taniguchi, M [1 ]
机构
[1] Kanazawa Inst Technol, Dept Biol & Chem, Nonoichi, Ishikawa 9218501, Japan
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中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Utilizing the unique capability of the scanning atom probe (SAP) various carbon specimens including CVD diamond and carbon nano-tubes (CNT) and polythiophene were mass analyzed by field evaporating surface atoms. The carbon specimens absorb a large amount of hydrogen. Hydrogen absorption and desorption characteristics of CNT may suggest that the hydrogen absorbability may be closely related with the fabrication process. The mass analysis of polythiophene indicates that sulfur atoms are strongly bound with carbon atoms and no single sulfur atom is detected. The mass spectrum of polythiophene indicates that the double bonds are stabler than the single bonds. Field emission characteristics of polythiophene suggests that the polythiophene is semiconductive and its work function is larger than that of silicon.
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页码:111 / 123
页数:13
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