Internal Field Measurements of Finite Length 1-D Form-Birefringent Periodic Structures

被引:0
作者
Rigdon, Shawn P. [1 ]
Pate, Mitchell [1 ]
Yang, Weiguo [1 ]
Graham, John D. [2 ]
Clare, Michael [2 ]
Woldeyohannes, Mesfin [3 ]
Schenk, John O. [4 ]
Ingel, Robert P. [4 ]
Fiddy, Michael A. [4 ]
机构
[1] Western Carolina Univ, Dept Engn & Technol, Kimmel Sch, Cullowhee, NC 28723 USA
[2] Western Carolina Univ, Ctr Rapid Product Realizat, Kimmel Sch, Cullowhee, NC 28723 USA
[3] Western Carolina Univ, Dept Chem & Phys, Cullowhee, NC 28723 USA
[4] Univ N Carolina, Ctr Optoelect & Opt Commun, Charlotte, NC 28223 USA
来源
2010 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (QELS) | 2010年
关键词
BAND-EDGE;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report measurements of internal field intensity distribution over 1-D form-birefringent periodic structures of finite length. Field distributions and field enhancement are verified but at significantly reduced strength attributed to small but finite material loss. (C) 2010 Optical Society of America
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页数:2
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