Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

被引：15
|
作者：
Jones, Michael W. M. [1 ,2 ,8 ,9 ]
Phillips, Nicholas W. [2 ,3 ]
van Riessen, Grant A. [4 ]
Abbey, Brian [2 ]
Vine, David J. [5 ]
Nashed, Youssef S. G. [6 ]
Mudie, Stephen T. [1 ]
Afshar, Nader [1 ]
Kirkham, Robin [7 ]
Chen, Bo [2 ]
Balaur, Eugeniu [2 ]
de Jonge, Martin D. [1 ]
机构：
[1] Australian Synchrotron, 800 Blackburn Rd, Clayton, Vic 3168, Australia
[2] La Trobe Univ, La Trobe Inst Mol Sci, ARC Ctr Excellence Adv Mol Imaging, Bundoora, Vic 3086, Australia
[3] CSIRO Mfg, Parkville, Vic 3052, Australia
[4] La Trobe Univ, Dept Chem & Phys, La Trobe Inst Mol Sci, Bundoora, Vic 3086, Australia
[5] Argonne Natl Lab, Adv Photon Source, Xray Sci Div, Argonne, IL 60439 USA
[6] Argonne Natl Lab, Math & Comp Sci Div, Argonne, IL 60439 USA
[7] CSIRO Mfg, Clayton, Vic 3168, Australia
[8] Queensland Univ Technol, Fac Hlth, Brisbane, Qld 4000, Australia
[9] Queensland Univ Technol, Inst Hlth & Biomed Innovat, Brisbane, Qld 4000, Australia
来源：
JOURNAL OF SYNCHROTRON RADIATION | 2016年 / 23卷
基金：
澳大利亚研究理事会;
关键词：
X-ray fluorescence; scanning X-ray diffraction microscopy; ptychography; PTYCHOGRAPHY; RESOLUTION; METALS;
D O I：
10.1107/S1600577516011917
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both stepand fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.
引用
收藏
页码：1151 / 1157
页数：7
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