Toward an accurate quantification in atom probe tomography reconstruction by correlative electron tomography approach on nanoporous materials

被引:18
作者
Mouton, Isabelle [1 ,2 ]
Printemps, Tony [1 ,2 ]
Grenier, Adeline [1 ,2 ]
Gambacorti, Narciso [1 ,2 ]
Pinna, Elisa [3 ]
Tiddia, Mariavitalia [3 ]
Vacca, Annalisa [4 ]
Mula, Guido [3 ]
机构
[1] Univ Grenoble Alpes, F-38000 Grenoble, France
[2] CEA, LETI, Minatec Campus, F-38054 Grenoble, France
[3] Univ Cagliari, Dipartimento Fis, Monserrato, Ca, Italy
[4] Univ Cagliari, Dipartimento Ingn Meccan Chim & Mat, Cagliari, Ca, Italy
关键词
Nanoporous; Atom probe tomography; Electron tomography; Correlation; POROUS SILICON; TIP SHAPE; MICROSCOPY; SCALE;
D O I
10.1016/j.ultramic.2017.06.007
中图分类号
TH742 [显微镜];
学科分类号
摘要
In this contribution, we propose a protocol for analysis and accurate reconstruction of nanoporous materials by atom probe tomography (APT). The existence of several holes in porous materials makes both the direct APT analysis and reconstruction almost inaccessible. In the past, a solution has been proposed by filling pores with electron beam-induced deposition. Here, we present an alternative solution using an electro-chemical method allowing to fill even small and dense pores, making APT analysis possible. Concerning the 3D reconstruction, the microstructural features observed by electron tomography are used to finely calibrate the APT reconstruction parameters. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:112 / 117
页数:6
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