GaN based HEMT technology for Power and RF applications

被引:0
|
作者
Heuken, Michael [1 ]
机构
[1] AIXTRON SE, Corp Res & Dev, Herzogenrath, Germany
来源
49TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2019) | 2019年
关键词
MOCVD; GaN based HEMT; epitaxy; production; HETEROSTRUCTURES;
D O I
10.1109/essderc.2019.8901784
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The paper reports on basic principles and the recent progress of the MOCVD production technology for manufacturing of wide bandgap semiconductor power device and RF stacks. High throughput processing built on wafer level automation, chamber cleaning technology for reliable chamber resetting and in-situ control of key process parameters are improving the robustness of the manufacturing process and ultimately lead to higher production yield and lower manufacturing cost. Basis for this development is the Planetary Reactor (R) allowing cost-effective multiwafer batch processes on 150 and 200 mm large area substrates with single wafer precision and uniformity.
引用
收藏
页码:17 / 20
页数:4
相关论文
共 50 条
  • [21] Modeling and experimental study on sensing response of an AlGaN/GaN HEMT-based hydrogen sensor
    Guo, Zhibo
    Wang, Lai
    Hao, Zhibiao
    Luo, Yi
    SENSORS AND ACTUATORS B-CHEMICAL, 2013, 176 : 241 - 247
  • [22] Integrated Voltage Reference Generator for GaN Smart Power Chip Technology
    Wong, King-Yuen
    Chen, Wanjun
    Chen, Kevin J.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2010, 57 (04) : 952 - 955
  • [23] First Demonstration of an N-Polar InAlGaN/GaN HEMT
    Hamwey, Robert
    Hatui, Nirupam
    Akso, Emre
    Wu, Feng
    Clymore, Christopher
    Keller, Stacia
    Speck, James S.
    Mishra, Umesh K.
    IEEE ELECTRON DEVICE LETTERS, 2024, 45 (03) : 328 - 331
  • [24] The thermal effect on the output conductance in AlGaN/GaN HEMT's
    Bellakhdar, A.
    Telia, A.
    Semra, L.
    Soltani, A.
    2012 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (ICM), 2012,
  • [25] Monolithic Bidirectional Lateral GaN Switches Reinvigorate Power Electronics Applications
    Veliadis, Victor
    Jahns, Thomas M.
    IEEE POWER ELECTRONICS MAGAZINE, 2025, 12 (01): : 22 - 28
  • [26] Improvement of Breakdown Characteristics of a GaN HEMT with AlGaN Buffer Layer
    Y. Chen
    Y. Jiang
    P.Q. Xu
    Z.G. Ma
    X.L. Wang
    T. He
    M.Z. Peng
    W.J. Luo
    X.Y. Liu
    L. Wang
    H.Q. Jia
    H. Chen
    Journal of Electronic Materials, 2012, 41 : 471 - 475
  • [27] Impact of layer structure on performance of unpassivated AlGaN/GaN HEMT
    Kordos, P
    Bernát, J
    Marso, M
    MICROELECTRONICS JOURNAL, 2005, 36 (3-6) : 438 - 441
  • [28] Extraction of AlGaN/GaN HEMT Gauge Factor in the Presence of Traps
    Koehler, Andrew D.
    Gupta, Amit
    Chu, Min
    Parthasarathy, Srivatsan
    Linthicum, Kevin J.
    Johnson, J. Wayne
    Nishida, Toshikazu
    Thompson, Scott E.
    IEEE ELECTRON DEVICE LETTERS, 2010, 31 (07) : 665 - 667
  • [29] Analytical Optimization of AlGaN/GaN/AlGaN DH-HEMT Device Performance Based on Buffer Characteristics
    Rahman, Sharidya
    Hatta, Sharifah Wan Muhamad
    Soin, Norhayati
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2019, 8 (02) : P165 - P173
  • [30] Enhanced RF Performance of InAlGaN/GaN HEMTs on Si Substrates with Thin GaN Channel and Quaternary Barrier Optimization
    Chiang, Tsung-Han
    Weng, You-Chen
    Lu, Chee-Hao
    Yang, Chih-Yi
    Li, Bing Syuan
    Chang, Chan-Yuen
    Chen, Chien-Wei
    Yu, Hung-Wei
    Kuo, Hao-Chung
    Chang, Edward-Yi
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2025, 14 (04)