Growth and piezoelectric properties of large size Ca3Ta(Ga0.5Al0.5)3Si2O14 crystals with langasite structure

被引:9
作者
Xiong, Kainan [1 ,2 ,3 ]
Wang, Sheng [1 ,3 ]
Tu, Xiaoniu [1 ,3 ]
Zheng, Yanqing [1 ,3 ]
Karaki, Tomoaki [2 ]
Shi, Erwei [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Ceram, Shanghai 201800, Peoples R China
[2] Toyama Prefectural Univ, Fac Engn, Imizu, Toyama 9390398, Japan
[3] Chinese Acad Sci, Suzhou Res Inst, Shanghai Inst Ceram, Taicang 215400, Jiangsu, Peoples R China
关键词
Crystal structure; X-ray diffraction; Czochralski method; Gallium compounds; Piezoelectric materials; SINGLE-CRYSTALS; TEMPERATURE PROPERTIES; MATERIAL CONSTANTS; GALLIUM PHOSPHATE; GDCA4O(BO3)(3); GAPO4;
D O I
10.1016/j.jcrysgro.2020.125525
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
4 in. Ca3Ta(Ga0.5Al0.5)(3)Si2O14 (CTGAS) in which 50% of Ga replaced by Al in Ca3TaGa3Si2O14(CTGS) crystal has been successfully grown by Czochralski technique. The full width at half-maximum (FWHM) of the rocking curves of five regions of CTGAS are found to be from 17.6 '' to 18.2 ''. All the effective segregation coefficients K-eff of chemical compositions are very close to 1. At room temperature, the piezoelectric coefficients d(11) and d(14) of CTGAS are found to be 3.96 pC/N and - 2.21 pC/N, and the electromechanical coupling coefficients k(12) and k(26) are determined as 9.3% and 29.9%, respectively. In the range from 500 degrees C to 800 degrees C, the X-cut of as-grown crystal possesses high electric resistivity. And the transmittances of CTGAS crystal are over 80% from 700 nm to 2700 nm.
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页数:4
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