Fabrication and characterization of large-core Yb/Al-codoped fused silica waveguides using dry etching

被引:4
作者
Atar, Gil [1 ,2 ]
Ternyak, Orna [3 ]
Greental, Doron [4 ]
Eger, David [1 ]
Chechelnitsky, Galina [4 ]
Mazurski, Noa
Gouta, Shifra [1 ]
Elbaz, Yehoudit [1 ]
Bruner, Ariel [1 ]
Sfez, Bruno [1 ]
Ruschin, Shlomo [2 ]
机构
[1] Soreq NRC, Div Appl Phys, IL-81800 Yavne, Israel
[2] Tel Aviv Univ, Fac Engn, Dept Elect Engn Phys Elect, IL-69978 Tel Aviv, Israel
[3] Technion Israel Inst Technol, Micro & Nanofabricat Unit, IL-32000 Haifa, Israel
[4] Hebrew Univ Jerusalem, Fac Sci, Ctr Nano Sci & Nanotechnol, IL-91904 Jerusalem, Israel
关键词
Fused silica; Dry etching; Al doping; Waveguide; Rare-earth doped silica; LASER; GLASSES;
D O I
10.1016/j.optmat.2014.10.048
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A deep inductively coupled plasma etching process was developed as a part of a continuous effort to develop an all-silica on-chip platform for high-power optical devices. Combined F and Cl based etching chemistry was found most suitable since silica matrix and Al doping are generally etched using different chemistries. First large-core (similar to 20 x 20 gm) Yb/Al-codoped fused silica waveguides on pure silica substrate were successfully fabricated, featuring similar to 1 dB/cm optical propagation loss. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:265 / 271
页数:7
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