Optical investigation of reduced graphene oxide by spectroscopic ellipsometry and the band-gap tuning

被引：49
|
作者：
Shen, Y. [1 ,2 ]
Zhou, P. [1 ,2 ]
Sun, Q. Q. [1 ,2 ]
Wan, L. [4 ]
Li, J. [4 ]
Chen, L. Y. [3 ]
Zhang, D. W. [1 ,2 ]
Wang, X. B. [4 ]
机构：
[1] Fudan Univ, Sch Microelect, ASIC, Shanghai 200433, Peoples R China
[2] Fudan Univ, Sch Microelect, Syst State Key Lab, Shanghai 200433, Peoples R China
[3] Fudan Univ, Dept Opt Sci & Engn, Shanghai 200433, Peoples R China
[4] Hubei Univ, Sch Mat Sci & Engn, Wuhan 430062, Peoples R China
来源：
APPLIED PHYSICS LETTERS | 2011年 / 99卷 / 14期
关键词：
ellipsometry; graphene; monolayers; optical constants; Raman spectra; visible spectra; ELECTRONIC-STRUCTURE; RAMAN-SPECTRA; TRANSPARENT; FILMS;
D O I：
10.1063/1.3646908
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Spectroscopic ellipsometry was used to characterize the optical response of few layer reduced graphene oxide and graphene oxide in visible range. Lorentz oscillator model is added to analyze the ellipsometric parameters. The experiment shows the optical response of few layer reduced graphene oxide and monolayer exfoliated graphene in visible range is quite similar with slight difference due to the structure defects. The Lorentz oscillator model gives experimental support to investigate the band-gap tuning through the reduction process in details. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3646908]
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页数：3
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