PUF-based Secure Test Wrapper Design for Network-on-Chip

被引：1

作者：

Zhang, Ying ^{[1
]}

Li, Yuanxiang ^{[1
]}

Chen, Xin ^{[1
]}

Yang, Jizhong ^{[1
]}

Hua, Yifeng ^{[1
]}

Yao, Jiaoyan ^{[1
]}

机构：

[1] Nanjing Univ Aeronaut & Astronaut, Coll Elect & Informat Engn, Nanjing, Peoples R China

来源：

2022 IEEE INTERNATIONAL SYMPOSIUM ON HARDWARE ORIENTED SECURITY AND TRUST (HOST) | 2022年

基金：

中国国家自然科学基金;

关键词：

Test Wrapper; Hardware Security; SoC Testing; Physically Unclonable Functions (PUF); IEEE; 1500; SCAN;

D O I：

10.1109/HOST54066.2022.9840115

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Without secure wrappers, it is impossible to protect the integrity of embedded IP cores for NoC-based SoC. This paper describes an IEEE 1500 compatible secure test wrapper NoC based on low-cost PUF circuit. The original key generated by LFSR is encrypted into a stream cipher by the PUF module, and the input key string should be equal to this cryptograph unless the wrapper is locked, which provides effective on-line authentication.

引用

页码：181 / 184

页数：4

共 19 条

[1] PUF-based Secure Test Wrapper for SoC Testing
Kumar, Sudeendra K.
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[2] PUF-based Secure Test Wrapper Design for Cryptographic SoC Testing
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[7] PLAKE: PUF-Based Secure Lightweight Authentication and Key Exchange Protocol for IoT
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[8] Obfuscated Challenge-Response: A Secure Lightweight Authentication Mechanism for PUF-Based Pervasive Devices
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Al-Sarawi, Said F.
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[9] A PUF-based unified identity verification framework for secure IoT hardware via device authentication
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[10] A PUF-based unified identity verification framework for secure IoT hardware via device authentication
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