High-precision assessment of interface lattice offset by quantitative HRTEM

被引：0

作者：

Schweinfest, R ^{[1
]}

Ernst, F ^{[1
]}

Wagner, T ^{[1
]}

Rühle, M ^{[1
]}

机构：

[1] Max Planck Inst Met Forsch, D-70174 Stuttgart, Germany

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1999年 / 194卷

关键词：

aluminium; interfaces; interface lattice offset; quantitative high-resolution; transmission electron microscopy; spinel; translation state;

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We introduce a new method to determine the 'lattice offset' or 'rigid-body shift' between two crystals forming an interface. Our method relies on quantitative evaluation of high-resolution transmission electron microscopy images. Employing the (001)-orientated interface between Al and MgAl2O4 in parallel orientation as a model system we demonstrate that we can assess the interface lattice offset with a precision in the picometre range.

引用

页码：142 / 151

页数：10

共 34 条

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