Time-resolved TEM beyond fast detectors

被引：0

作者：

Flannigan, D. ^{[1
]}

Chen, J. ^{[1
]}

Curtis, W. ^{[1
]}

Du, D. ^{[1
]}

Engen, P. ^{[1
]}

VandenBussche, E. ^{[1
]}

Zhang, Y. ^{[1
]}

机构：

[1] Univ Minnesota, Dept Chem Engn & Mat Sci, 421 Washington Ave SE, Minneapolis, MN 55455 USA

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2021年 / 77卷

基金：

美国国家科学基金会;

关键词：

4D ultrafast electron microscopy; dynamic TEM; automation; synchronization; radiation damage;

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

MS-64-2

引用

页码：C420 / C420

页数：1

共 6 条

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