End-of-Waste SiC-Based Flexible Substrates with Tunable Electrical Properties for Electronic Applications

被引:5
作者
Del Mauro, Anna De Girolamo [1 ]
Galvagno, Sergio [1 ]
Nenna, Giuseppe [1 ]
Miscioscia, Riccardo [1 ]
Minarini, Carla [1 ]
Portofino, Sabrina [1 ]
机构
[1] ENEA, SSPT PROMAS NANO, Piazzale E Fermi 1, I-80055 Portici, Italy
关键词
SILICON-CARBIDE NANOPARTICLES; PERCOLATION-THRESHOLD; IMPURITY CONDUCTION; TEMPERATURE; COMPOSITES; NANOCOMPOSITES; DEPENDENCE; POWDERS; POLYSTYRENE; MORPHOLOGY;
D O I
10.1021/acs.langmuir.6b02716
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We demonstrated the suitability of polymer composites filled with silicon carbide (SiC) powders derived from a recycling process for applications in electronic devices manufacturing. SiC powders have been synthesized from the process byproducts and used as fillers in the formulation of polystyrene (PS)/SiC composites, which have been used in the preparation of substrates using the solution-casting technique. Different substrates have been prepared by changing the concentration of SiC in the composite in the range from 6.7 to 67 wt % and used in simple electronic devices by performing gold contacts in both planar and stacked configurations. The electrical behaviors of both stacked and planar devices were investigated in direct current (DC) and alternate current (AC) regimes. The experimental results showed that charge percolation could be considered an explanation for the abrupt change in the differential conductivity observed around 30 wt %. Fowler-Nordheim tunneling at high fields has been found to be compatible with static characteristics and with high-frequency AC measurements and, therefore, charge tunneling between SiC islands has been proposed as the physical mechanism provoking the changes in charge transport in the substrates investigated. From this first experimental analysis, it appears that SiC/PS composites could suit their use in tunneling-gate dielectrics (i.e., in transistors suitable for their applications in nonvolatile random-access memory) for low concentrations or as a continuous semiconducting media when SiC is dispersed in high-concentration composites.
引用
收藏
页码:10497 / 10504
页数:8
相关论文
共 55 条
[1]   Temperature dependence of Fowler-Nordheim current in 6H- and 4H-SiC MOS capacitors [J].
Agarwal, AK ;
Seshadri, S ;
Rowland, LB .
IEEE ELECTRON DEVICE LETTERS, 1997, 18 (12) :592-594
[2]  
Barbieri L., 2015, WASTE 2015, P19
[3]   Direct current and alternating current electrical transport properties of regioregular poly[3-(4-alkoxyphenyl)-thiophenes] [J].
Barra, M. ;
Biasiucci, M. ;
Cassinese, A. ;
D'Angelo, P. ;
Barone, A. C. ;
Carella, A. ;
Roviello, A. .
JOURNAL OF APPLIED PHYSICS, 2007, 102 (09)
[4]   Transition from direct tunneling to field emission in metal-molecule-metal junctions [J].
Beebe, Jeremy M. ;
Kim, BongSoo ;
Gadzuk, J. W. ;
Frisbie, C. Daniel ;
Kushmerick, James G. .
PHYSICAL REVIEW LETTERS, 2006, 97 (02)
[5]   Nonvolatile RRAM Cells from Polymeric Composites Embedding Recycled SiC Powders [J].
Del Mauro, Anna De Girolamo ;
Nenna, Giuseppe ;
Miscioscia, Riccardo ;
Freda, Cesare ;
Portofino, Sabrina ;
Galvagno, Sergio ;
Minarini, Carla .
LANGMUIR, 2014, 30 (41) :12421-12428
[6]   Study of the effect of the doped poly(3,4-ethylenedioxythiophene): poly(styrene sulfonate) polymeric anode on the organic light-emitting diode performances [J].
Del Mauro, Anna De Girolamo ;
Nenna, Giuseppe ;
Villani, Fulvia ;
Minarini, Carla .
THIN SOLID FILMS, 2012, 520 (16) :5386-5391
[7]   Transparent Polystyrene Substrates with Controllable Surface Chlorosulfonation: Stable, Versatile, and Water-Compatible Precursors for Functionalization [J].
del Prado, Anselmo ;
Briz, Nerea ;
Navarro, Rodrigo ;
Perez, Monica ;
Gallardo, Alberto ;
Reinecke, Helmut .
MACROMOLECULES, 2012, 45 (06) :2648-2653
[8]   Spatially correlated charge transport in organic thin film transistors [J].
Dinelli, F ;
Murgia, M ;
Levy, P ;
Cavallini, M ;
Biscarini, F ;
de Leeuw, DM .
PHYSICAL REVIEW LETTERS, 2004, 92 (11) :116802-1
[9]   CRITICAL BEHAVIOR OF CONDUCTIVITY AND DIELECTRIC-CONSTANT NEAR METAL-NON-METAL TRANSITION THRESHOLD [J].
EFROS, AL ;
SHKLOVSKII, BI .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1976, 76 (02) :475-485
[10]   Electron emission in intense electric fields [J].
Fowler, RH ;
Nordheim, L .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1928, 119 (781) :173-181