Improvement of the homogeneity of optical thin films by ion-assisted deposition

被引:0
作者
Lee, CC [1 ]
Liou, YY [1 ]
Jaing, CC [1 ]
机构
[1] NATL CENT UNIV,INST OPT SCI,CHUNGLI 320,TAIWAN
关键词
D O I
暂无
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The inhomogeneity of thin films of ZrO2 and TiO2 was reduced by ion beam bombardment with mixed argon and oxygen as a working gas during deposition. The inhomogeneities of the films were calculated from transmission monitoring curves. The optimum ion beam voltage and ion beam current density are 900 V and 12 mu A cm(-2) for ZrO2 film, and 300 V and 15 mu A cm(-2) for TiO2 film.
引用
收藏
页码:1149 / 1154
页数:6
相关论文
共 25 条
[1]  
Allen T. H., 1983, Proceedings of the International Ion Engineering Congress. The 7th Symposium (1983 International) on Ion Sources and Ion Assisted Technology (ISIAT '83) and the 4th International Conference on Ion and Plasma Assisted Techniques (IPAT '83), P1305
[2]   MULTIPLE DETERMINATION OF THE OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS [J].
ARNDT, DP ;
AZZAM, RMA ;
BENNETT, JM ;
BORGOGNO, JP ;
CARNIGLIA, CK ;
CASE, WE ;
DOBROWOLSKI, JA ;
GIBSON, UJ ;
HART, TT ;
HO, FC ;
HODGKIN, VA ;
KLAPP, WP ;
MACLEOD, HA ;
PELLETIER, E ;
PURVIS, MK ;
QUINN, DM ;
STROME, DH ;
SWENSON, R ;
TEMPLE, PA ;
THONN, TF .
APPLIED OPTICS, 1984, 23 (20) :3571-3596
[3]   COMPARISON OF THE PROPERTIES OF TITANIUM-DIOXIDE FILMS PREPARED BY VARIOUS TECHNIQUES [J].
BENNETT, JM ;
PELLETIER, E ;
ALBRAND, G ;
BORGOGNO, JP ;
LAZARIDES, B ;
CARNIGLIA, CK ;
SCHMELL, RA ;
ALLEN, TH ;
TUTTLEHART, T ;
GUENTHER, KH ;
SAXER, A .
APPLIED OPTICS, 1989, 28 (16) :3303-3317
[4]   AUTOMATIC-DETERMINATION OF THE OPTICAL-CONSTANTS OF INHOMOGENEOUS THIN-FILMS [J].
BORGOGNO, JP ;
LAZARIDES, B ;
PELLETIER, E .
APPLIED OPTICS, 1982, 21 (22) :4020-4029
[5]   OPTICAL-CONSTANTS DERIVATION FOR AN INHOMOGENEOUS THIN-FILM FROM INSITU TRANSMISSION MEASUREMENTS [J].
BOVARD, B ;
VANMILLIGEN, FJ ;
MESSERLY, MJ ;
SAXE, SG ;
MACLEOD, HA .
APPLIED OPTICS, 1985, 24 (12) :1803-1807
[6]  
BOVARD B, 1995, ION ASSISTED DEPOSIT
[7]   ESTIMATE OF THE DEGREE OF INHOMOGENEITY OF THE REFRACTIVE-INDEX OF DIELECTRIC FILMS FROM SPECTROSCOPIC ELLIPSOMETRY [J].
DELARIVIERE, GP ;
FRIGERIO, JM ;
RIVORY, J ;
ABELES, F .
APPLIED OPTICS, 1992, 31 (28) :6056-6061
[8]   SURFACE OPTICAL COATINGS BY ION ASSISTED DEPOSITION TECHNIQUES - STUDY OF UNIFORMITY [J].
FLORY, F ;
PELLETIER, E ;
ALBRAND, G ;
HU, Y .
APPLIED OPTICS, 1989, 28 (14) :2952-2959
[9]  
GUNTHER KH, 1976, APPL OPTICS, V15, P2992
[10]   ION ASSISTED DEPOSITION OF THERMALLY EVAPORATED AG AND AL FILMS [J].
HWANGBO, CK ;
LINGG, LJ ;
LEHAN, JP ;
MACLEOD, HA ;
MAKOUS, JL ;
KIM, SY .
APPLIED OPTICS, 1989, 28 (14) :2769-2778