X-ray reflectivity study of temperature-dependent surface layering in liquid Hg

被引：82
|
作者：
DiMasi, E [1 ]
Tostmann, H
Ocko, BM
Pershan, PS
Deutsch, M
机构：
[1] Brookhaven Natl Lab, Dept Phys, Upton, NY 11973 USA
[2] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA
[3] Harvard Univ, Div Engn & Appl Sci, Cambridge, MA 02138 USA
[4] Bar Ilan Univ, Dept Phys, IL-52100 Ramat Gan, Israel
来源：
PHYSICAL REVIEW B | 1998年 / 58卷 / 20期
关键词：
D O I：
10.1103/PhysRevB.58.R13419
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We report x-ray reflectivity measurements of liquid mercury between -36 degrees C and +25 degrees C. The surface structure can be described by a layered density profile convolved with a thermal roughness sigma(Tau). The layering has a spacing of 2.72 Angstrom and an exponential decay length of 5.0 Angstrom. Surprisingly, sigma(Tau) is found to increase considerably faster with temperature than the root Tau behavior predicted by capillary wave theory, in contrast with previous measurements on Ga and dielectric liquids. [S0163-1829(98)52144-3]
引用
收藏
页码：13419 / 13422
页数：4
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