Dynamics in ultrathin liquid films studied by simultaneous dielectric spectroscopy (DRS) and organic molecular beam deposition (OMBD)

被引:7
|
作者
Wuebbenhorst, M. [1 ]
Capponi, S. [1 ]
Napolitano, S. [1 ]
Rozanski, S. [1 ]
Couderc, G. [2 ]
Behrnd, N. -R. [2 ]
Hulliger, J. [2 ]
机构
[1] Katholieke Univ Leuven, Dept Phys & Astron, B-3001 Louvain, Belgium
[2] Univ Bern, Dept Chem & Biochem, CH-3012 Bern, Switzerland
来源
EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS | 2010年 / 189卷 / 01期
关键词
GLASS-TRANSITION TEMPERATURE; POLYMER-FILMS; BULK BEHAVIOR; CONFINEMENT; DEVIATIONS; MOBILITY; LENGTH; LAYERS;
D O I
10.1140/epjst/e2010-01321-1
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Real-time dielectric relaxation spectroscopy for a molecular beam deposited glass forming liquids is proposed as a versatile approach for the study of the dynamic glass transition in geometric confinement. To achieve the highest sensitivity down to monomolecular organic layers in a wide frequency range (0.1-10(7) Hz) during simultaneous deposition and desorption, we have used mu m spaced interdigitated electrodes under ultrahigh vacuum conditions. Experiments using glycerol deposited on fused silica at -40 degrees C revealed a dielectric glass transition process for a layer thickness as low as 0.7 nm. While its peak position hardly changes upon thickness reduction, a clear broadening is observed that implies an increasing heterogeneous mobility scenario for the thinnest films caused by molecules being part of a reduced (at the substrate) or enhanced (free surface) mobility layer. This finding is supported by desorption experiments that reveal a strong retardation of the desorption rate for films below 1 nm.
引用
收藏
页码:181 / 186
页数:6
相关论文
共 50 条
  • [1] Dynamics in ultrathin liquid films studied by simultaneous dielectric spectroscopy (DRS) and organic molecular beam deposition (OMBD)
    M. Wübbenhorst
    S. Capponi
    S. Napolitano
    S. Rozanski
    G. Couderc
    N.-R. Behrnd
    J. Hulliger
    The European Physical Journal Special Topics, 2010, 189 : 181 - 186
  • [2] Characterization of alpha-sexithienyl thin films deposited by OMBD (Organic Molecular Beam Deposition) technique
    Park, YI
    Kwon, OK
    Choi, JS
    Kim, YK
    Shin, DM
    Kang, DY
    PROCEEDINGS OF THE 5TH INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 AND 2, 1997, : 617 - 619
  • [3] Ultrathin organic films grown by organic molecular beam deposition and related techniques
    Forrest, SR
    CHEMICAL REVIEWS, 1997, 97 (06) : 1793 - 1896
  • [4] Growth of ultrathin films of substituted sexithiophene by organic molecular beam deposition
    Sassella, A
    Borghesi, A
    Destri, S
    Porzio, W
    Tubino, R
    SYNTHETIC METALS, 1999, 101 (1-3) : 530 - 531
  • [5] Growth of ultrathin films of substituted sexithiophene by organic molecular beam deposition
    Sassella, A.
    Borghesi, A.
    Destri, S.
    Porzio, W.
    Tubino, R.
    Synthetic Metals, 1999, 101 (01): : 530 - 531
  • [6] Growth of ultrathin films of substituted sexithiophene by organic molecular beam deposition
    Istituto Nazionale per la Fisica della Materia, Dipartimento di Scienza dei Materiali, Università di Milano, via Emanueli 15, I-20126 Milan, Italy
    不详
    Synth Met, 1 (530-531):
  • [7] Dynamics of three generations of PAMAM dendrimers as studied by Dielectric Relaxation Spectroscopy (DRS)
    Mijovic, Jovan
    Ristic, Sanja
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2006, 231
  • [8] Dynamics of water-protein interactions as studied by dielectric relaxation spectroscopy (DRS).
    Mijovic, J
    Bian, Y
    Gross, R
    Chen, B
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2005, 229 : U776 - U776
  • [9] Trap distribution and field effect transistor (FET) of perylene by organic molecular beam deposition (OMBD)
    Choi, TY
    Kang, HS
    Park, DH
    Koo, JM
    Lee, JK
    Ahn, SD
    Joo, J
    SYNTHETIC METALS, 2003, 137 (1-3) : 929 - 930
  • [10] Fluorescence spectroscopy of ultrathin molecular organic films on surfaces
    Mueller, M.
    Langner, A.
    Krylova, O.
    Le Moal, E.
    Sokolowski, M.
    APPLIED PHYSICS B-LASERS AND OPTICS, 2011, 105 (01): : 67 - 79