Advances in high-resolution transmission electron microscopy

High-resolution transmission electron microscopy (HRTEM) has developed to a state capable of providing structural information on an atomic scale. Recent advances in instrumentation as well as in new strategies of imaging and information retrieval have extended the resolution towards the 0.1 nm level. Development of schemes for digital image analysis have made HRTEM to a quantitative technique which allows to determine the atomic structure of materials with sub-Angstrom accuracy. HRTEM is widely applied in many scientific fields to explore the static atomic configurations of defects and small particles. Moreover, in-situ studies of dynamic processes have become feasible on an atomic scale.