A review of recent developments and applications in the field of X-ray diffraction for residual stress studies

被引:29
作者
Lu, J [1 ]
Retraint, D [1 ]
机构
[1] Univ Technol Troyes, LASMIS, Mech Syst & Concurrent Engn Lab, Troyes, France
关键词
X-ray; diffraction; residual stresses; review;
D O I
10.1243/0309324981512869
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Much research effort has been conducted recently in the field of residual stresses. This presentation is a review of different studies carried out during the last few years on the X-ray diffraction technique. The first part of this paper presents an introduction to the residual stresses and the different techniques of measurement. The second part of this paper is focused on the X-ray diffraction technique. Then the different factors that affect the measurement results are discussed and some examples shown for different applications of the X-ray method. The last part of the work deals with the residual stress measurement techniques and the overall necessity to combine destructive (incremental hole drilling) and non-destructive (X-ray and neutron diffraction) methods in order to evaluate precisely the residual stress distribution.
引用
收藏
页码:127 / 136
页数:10
相关论文
共 53 条
[1]  
BARALLE D, 1990, P S SPAC APPL ADV ST
[2]   X-RAY MACROSTRESS DETERMINATION ON TEXTURED MATERIAL - USE OF THE ODF FOR CALCULATING THE X-RAY COMPLIANCES [J].
BARRAL, M ;
LEBRUN, JL ;
SPRAUEL, JM ;
MAEDER, G .
METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1987, 18 (07) :1229-1238
[3]  
BARRAL M, 1983, EIGENSPANNUNGEN, V2, P31
[4]  
BORDEAUX F, 1992, SURFACE COATINGS TEC, V53, P45
[5]  
BRACKMAN CM, 1987, ACTA CRYSTALLOGR A, V43, P270
[6]  
BRACKMAN CM, 1983, J APPL CRYSTALLOGR, V16, P325
[7]  
*CETIM, 1990, REC C JOURN NAT CONT
[8]  
DEBUYSER L, 1991, RESIDUAL STRESSES ME, P27
[9]  
EIGENMANN B, 1995, Z METALLKD, V86, P84
[10]   History and current status of X-ray stress analysis [J].
Eigenmann, B ;
Macherauch, E .
JOURNAL DE PHYSIQUE IV, 1996, 6 (C4) :151-185