Using electrical bitmap results from embedded memory to enhance yield

被引：31

作者：

Segal, J ^{[1
]}

Jee, A ^{[1
]}

Lepejian, D ^{[1
]}

Chu, B ^{[1
]}

机构：

[1] HPL, Tech Staff, San Jose, CA 95110 USA

来源：

IEEE DESIGN & TEST OF COMPUTERS | 2001年 / 18卷 / 03期

关键词：

D O I：

10.1109/54.922801

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Analyzing bitmap results can provide insight into physical failure mechanisms normally acquired only through the complex, time-consuming, and expensive process of failure analysis.

引用

页码：28 / 39

页数：12

共 13 条

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