YIELD, YIELD COMPONENTS, AND ACCURACY OF GRAIN IN SELECTED CULTIVARS OF OATS

Under the investigation project, carried out in the years 2006 - 2008 at the Plant Breeding Station of Polanowice near Cracow, the yield, yield components, and accuracy of grain of nine husked cultivars of oats were compared. The highest yield of grain (8 48 t.ha(-1)) was obtained during the first year (2006), and the lowest yield (5 64 t ha(-1)) during the second year (2007) of the experiment. The yield components had a significant effect on the yield level in individual vegetation seasons, and, first of all, the number of panicles per sq meter In 2006, the plants developed 527 panicles per sq. meter. i e 34 % more than in 2007, and 25 % more compared to 2008. Depending on the year of investigations, the number of grains per panicles of the husks cultivars ranged from 46 4 in 2006 to 59 6 in 2008 In addition, statistically significant differences were found in the content of grain fraction depending on the year of investigation The highest amount of tailings (over 6 3 % more compared to 2007) was found in the specimens taken in 2006, which was the year of the highest grain yield Amidst the oat cultivars under comparison, the Rajtar cultivar had the highest yield (the average of three years was 7.39 t.ha(-1)), and the Polar naked oat cultivar had the lowest yield (4.67 t.ha(-1)) The mass of 1000 grains had a significant effect on the yields achieved; as for the husked cultivars, it was from 31 7 to 37 8 g, and as for the Polar naked cultivar 28 5 g The highest content of husk in the grain (32 4 %) was found in the best yielding Rajtar cultivar, whereas the Polar cultivar developed the highest plants The cultivars compared did not differ in the contents of individual fractions in the grain yield.