Synthesis and characterization of Sn2+ oxides with the pyrochlore structure

被引：23

作者：

Mizoguchi, Hiroshi ^{[1
,2
]}

Wattiaux, A. ^{[3
]}

Kykyneshi, R. ^{[4
]}

Tate, J. ^{[4
]}

Sleight, A. W. ^{[1
,2
]}

Subramanian, M. A. ^{[1
,2
]}

机构：

[1] Oregon State Univ, Dept Chem, Corvallis, OR 97331 USA

[2] Oregon State Univ, Oregon State Univ Mat Inst, Corvallis, OR 97331 USA

[3] Univ Bordeaux 1, CNRS, Inst Chim Matiere Condensee Bordeaux, F-33608 Pessac, France

[4] Oregon State Univ, Dept Phys, Corvallis, OR 97331 USA

来源：

MATERIALS RESEARCH BULLETIN | 2008年 / 43卷 / 8-9期

关键词：

oxides; Mossbauer spectroscopy; X-ray diffraction; dielectric properties; optical properties;

D O I：

10.1016/j.materresbull.2008.03.011

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

During synthesis of Sn-2(2+) M2X6+x compounds with the pyrochlore structure, some disproportionation of the Sn2+ always occurred. This in turn led to some incorporation of Sn4+ into the octahedral (M) sites of the pyrochlore structure. The actual amount of Sn4+ incorporation was determined by Sn-119 Mossbauer spectroscopy for two compounds. Mossbauer spectroscopy also indicated that Sn2+ was strongly displaced from its ideal site in the pyrochlore structure. The compounds Sn2TiNbO6F, Sn2Ti0.9Ta1.1(O,F)(7), Sn-2(2+) (Sn0.254+W1.22Sc0.53)O-6.96, and Sn-1.4(2+)(Sn-0.19(4+) Ti1.06W0.75)O-6.15 with the pyrochlore structure are yellow to red with band gaps determined from diffuse reflectance ranging from 1.9 to 2.3 eV. The dielectric constant of Sn2+ pyrochlores examined ranged from 31 to 149. (C) 2008 Elsevier Ltd. All rights reserved.

引用

页码：1943 / 1948

页数：6

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