Helium reflectivity of the Si(111)-(1X1) H surface for use in atom optical elements

被引：11
|
作者：
Buckland, JR [1 ]
Holst, B [1 ]
Allison, W [1 ]
机构：
[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
来源：
CHEMICAL PHYSICS LETTERS | 1999年 / 303卷 / 1-2期
关键词：
D O I：
10.1016/S0009-2614(99)00182-7
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We investigate the reflectivity of Si(111)-(1 x 1) H for helium atoms with particular reference to atom optical applications, which require a high specular reflectivity. Quantum close-coupling calculations using an empirical potential are used to identify the optimum scattering conditions. We show that a diffraction probability > 0.5 in the specular channel can be obtained in a kinematic window near 20 meV with near-normal incidence (polar angle < 5 degrees). (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：107 / 110
页数：4
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