Automated Testing for Sustainable Remote Laboratory System

被引：0

作者：

Chandrashekar, Kyathsandra Narasimhamurthy ^{[1
]}

Nataraja, Susheen Srivatsa Chelur ^{[1
]}

Chandrasekhar, Bharath Gangarpu ^{[1
]}

Prasanna, Adithya ^{[1
]}

Vankalkunti, Suchitra ^{[1
]}

机构：

[1] Siddaganga Inst Technol, Tumkur, India

来源：

ONLINE ENGINEERING AND SOCIETY 4.0 | 2022年 / 298卷

关键词：

Remote laboratory; Automatic testing; Monostable multivibrator;

D O I：

10.1007/978-3-030-82529-4_6

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

In this paper, performance analysis of Automated testing of different circuits in Remote laboratory are presented. Remote laboratory system for Analog Electronic circuits has more than 30 experiments. It's necessary to monitor the working condition of each experiment 24/7 for effective usage of the system. It's humanly difficult to check different types of experiments all the time. So, it's necessary to automate this testing process and inform the maintenance team for about the health condition of the circuits. The automatic testing system is aimed testing the system at regular interval and inform about the faulty circuits. Paper also presents typical analysis report of monostable multivibrator experiment considered for testing.

引用

页码：55 / 65

页数：11

共 5 条

[1] What remote labs can do for you [J].

de la Torre, Luis ;

Pedro Sanchez, Juan ;

Dormido, Sebastian .

PHYSICS TODAY, 2016, 69 (04) :48-53

[2] The Ball and Beam System: A Case Study of Virtual and Remote Lab Enhancement With Moodle [J].

de la Torre, Luis ;

Guinaldo, Maria ;

Heradio, Ruben ;

Dormido, Sebastian .

IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2015, 11 (04) :934-945

[3] Virtual and remote labs in control education: A survey [J].

Heradio, Ruben ;

de la Torre, Luis ;

Dormido, Sebastian .

ANNUAL REVIEWS IN CONTROL, 2016, 42 :1-10

[4]

HESSELINK L, 2003, INT J DIST EDUC TECH, V1, P21

[5] A Fully Integrated Open Solution for the Remote Operation of Pilot Plants [J].

Sanchez-Herrera, Reyes ;

Mejias, Andres ;

Marquez, Marco A. ;

Andujar, Jose M. .

IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2019, 15 (07) :3943-3951

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