Initial growth stages of AlF3 on Cu(100): an STM study

被引：3

作者：

Moreno-Lopez, J. C. ^{[1
]}

Passeggi, M. C. G., Jr. ^{[1
]}

Ruano, G. ^{[1
]}

Vidal, R. A. ^{[1
]}

Ferron, J. ^{[1
]}

机构：

[1] Inst Desarrollo Tecnol Ind Quim INTEC CONICET UNL, Lab Superficies & Interfaces, RA-3450 Guemes, Santa Fe, Argentina

来源：

PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7, NO 11-12 | 2010年 / 7卷 / 11-12期

关键词：

insulator-metal interface; STM; AlF3; growth; annealing; ELECTRON-BEAM; THIN-FILMS; PHASE-TRANSITIONS; MICROSCOPY; RESIST;

D O I：

10.1002/pssc.200983806

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In this study we present results concerning the early growth stages of an insulator-metal interface by means of scanning tunnelling microscopy. In particular, we report the growth of aluminium fluoride (AlF3) islands over a Cu(100) surface at room temperature, from sub-monolayer coverages up to 1.25 monolayers. These islands cover the substrate with a single monolayer film up to depositions of 0.80 monolayers, with 3D growth beyond this coverage. High voltages (V >= 2.50 V) are needed to obtain STM images, showing the insulator character of the AlF3 islands. Important modifications are observed in the AlF3/Cu(100) surface after an annealing treatment. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

引用

收藏

页码：2712 / 2715

页数：4

相关论文

共 21 条

[1] Growth of NiO(100) layers on Ag(100): Characterization by scanning tunneling microscopy [J].

Bertrams, T ;

Neddermeyer, H .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02) :1141-1144

[2] Epitaxial growth of CaF2(111) on Cu(111) visualized by STM [J].

Calleja, F ;

Hinarejos, JJ ;

de Parga, ALV ;

Suturin, SM ;

Sokolov, NS ;

Miranda, R .

SURFACE SCIENCE, 2005, 582 (1-3) :14-20

[3] Contrast reversal and shape changes of atomic adsorbates measured with scanning tunneling microscopy [J].

Calleja, F ;

Arnau, A ;

Hinarejos, JJ ;

de Parga, ALV ;

Hofer, WA ;

Echenique, PM ;

Miranda, R .

PHYSICAL REVIEW LETTERS, 2004, 92 (20) :206101-1

[4] Investigation of the proximity effect in amorphous AlF3 electron-beam resists [J].

Chen, GS ;

Humphreys, CJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (06) :1954-1960

[5] Investigation of electron-beam-induced phase transitions in amorphous aluminum trifluoride thin films using transmission electron microscopy [J].

Chen, GS .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1999, 17 (02) :403-410

[6] A STUDY OF THE STRUCTURAL PHASE-TRANSITIONS IN ALF3 - X-RAY-POWDER DIFFRACTION, DSC AND RAMAN-SCATTERING INVESTIGATIONS OF THE LATTICE-DYNAMICS AND PHONON-SPECTRUM [J].

DANIEL, P ;

BULOU, A ;

ROUSSEAU, M ;

NOUET, J ;

FOURQUET, JL ;

LEBLANC, M ;

BURRIEL, R .

JOURNAL OF PHYSICS-CONDENSED MATTER, 1990, 2 (26) :5663-5677

[7] ATOMIC VIEW OF SURFACE SELF-DIFFUSION - TUNGSTEN ON TUNGSTEN [J].

EHRLICH, G ;

HUDDA, FG .

JOURNAL OF CHEMICAL PHYSICS, 1966, 44 (03) :1039-&

[8] Observation of a novel nucleation mechanism at step edges:: LiF molecules on Ag(111) [J].

Farías, D ;

Braun, KF ;

Fölsch, S ;

Meyer, G ;

Rieder, KH .

SURFACE SCIENCE, 2000, 470 (1-2) :L93-L98

[9] Self-organized patterning of an insulator-on-metal system by surface faceting and selective growth:: NaCl/Cu(211) [J].

Fölsch, S ;

Helms, A ;

Zöphel, S ;

Repp, J ;

Meyer, G ;

Rieder, KH .

PHYSICAL REVIEW LETTERS, 2000, 84 (01) :123-126

[10] WSXM:: A software for scanning probe microscopy and a tool for nanotechnology [J].

Horcas, I. ;

Fernandez, R. ;

Gomez-Rodriguez, J. M. ;

Colchero, J. ;

Gomez-Herrero, J. ;

Baro, A. M. .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (01)