共 20 条
An Approach for Estimating the Reliability of IGBT Power Modules in Electrified Vehicle Traction Inverters
被引:8
作者:

Kundu, Animesh
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Windsor, Ctr Hybrid Automot Res & Green Energy CHARGE Labs, Windsor, ON N9B 3P4, Canada Univ Windsor, Ctr Hybrid Automot Res & Green Energy CHARGE Labs, Windsor, ON N9B 3P4, Canada

Balamurali, Aiswarya
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Windsor, Ctr Hybrid Automot Res & Green Energy CHARGE Labs, Windsor, ON N9B 3P4, Canada Univ Windsor, Ctr Hybrid Automot Res & Green Energy CHARGE Labs, Windsor, ON N9B 3P4, Canada

Korta, Philip
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Windsor, Ctr Hybrid Automot Res & Green Energy CHARGE Labs, Windsor, ON N9B 3P4, Canada Univ Windsor, Ctr Hybrid Automot Res & Green Energy CHARGE Labs, Windsor, ON N9B 3P4, Canada

Iyer, K. Lakshmi Varaha
论文数: 0 引用数: 0
h-index: 0
机构:
Magna Int Inc, Corp Engn & R&D, Troy, MI 48098 USA Univ Windsor, Ctr Hybrid Automot Res & Green Energy CHARGE Labs, Windsor, ON N9B 3P4, Canada

Kar, Narayan C.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Windsor, Ctr Hybrid Automot Res & Green Energy CHARGE Labs, Windsor, ON N9B 3P4, Canada Univ Windsor, Ctr Hybrid Automot Res & Green Energy CHARGE Labs, Windsor, ON N9B 3P4, Canada
机构:
[1] Univ Windsor, Ctr Hybrid Automot Res & Green Energy CHARGE Labs, Windsor, ON N9B 3P4, Canada
[2] Magna Int Inc, Corp Engn & R&D, Troy, MI 48098 USA
来源:
基金:
加拿大自然科学与工程研究理事会;
关键词:
Arrhenius model;
losses;
mission profile;
inverter;
powertrain;
Rainflow algorithm;
reliability;
thermal network;
electric vehicle;
TEMPERATURE;
PREDICTION;
DESIGN;
D O I:
10.3390/vehicles2030022
中图分类号:
TH [机械、仪表工业];
学科分类号:
0802 ;
摘要:
The reliability analysis of traction inverters is of great interest due to the use of new semi-conductor devices and inverter topologies in electric vehicles (EVs). Switching devices in the inverter are the most vulnerable component due to the electrical, thermal and mechanical stresses based on various driving conditions. Accurate stress analysis of power module is imperative for development of compact high-performance inverter designs with enhanced reliability. Therefore, this paper presents an inverter reliability estimation approach using an enhanced power loss model developed considering dynamic and transient influence of power semi-conductors. The temperature variation tracking has been improved by incorporating power module component parameters in an LPTN model of the inverter. A 100 kW EV grade traction inverter is used to validate the developed mathematical models towards estimating the inverter performance and subsequently, predicting the remaining useful lifetime of the inverter against two commonly used drive cycles.
引用
收藏
页码:413 / 423
页数:11
相关论文
共 20 条
[1]
A High-Precision Adaptive Thermal Network Model for Monitoring of Temperature Variations in Insulated Gate Bipolar Transistor (IGBT) Modules
[J].
An, Ning
;
Du, Mingxing
;
Hu, Zhen
;
Wei, Kexin
.
ENERGIES,
2018, 11 (03)

论文数: 引用数:
h-index:
机构:

Du, Mingxing
论文数: 0 引用数: 0
h-index: 0
机构:
Tianjin Univ Technol, Tianjin Key Lab Control Theory & Applicat Complic, Tianjin 300384, Peoples R China Tianjin Univ Technol, Tianjin Key Lab Control Theory & Applicat Complic, Tianjin 300384, Peoples R China

Hu, Zhen
论文数: 0 引用数: 0
h-index: 0
机构:
Tianjin Univ, Sch Elect Engn & Automat, Tianjin 300072, Peoples R China Tianjin Univ Technol, Tianjin Key Lab Control Theory & Applicat Complic, Tianjin 300384, Peoples R China

Wei, Kexin
论文数: 0 引用数: 0
h-index: 0
机构:
Tianjin Univ Technol, Tianjin Key Lab Control Theory & Applicat Complic, Tianjin 300384, Peoples R China Tianjin Univ Technol, Tianjin Key Lab Control Theory & Applicat Complic, Tianjin 300384, Peoples R China
[2]
Mission-Profile-Based Lifetime Prediction for a SiC MOSFET Power Module Using a Multi-Step Condition-Mapping Simulation Strategy
[J].
Ceccarelli, Lorenzo
;
Kotecha, Ramchandra M.
;
Bahman, Amir Sajjad
;
Iannuzzo, Francesco
;
Mantooth, Homer Alan
.
IEEE TRANSACTIONS ON POWER ELECTRONICS,
2019, 34 (10)
:9698-9708

Ceccarelli, Lorenzo
论文数: 0 引用数: 0
h-index: 0
机构:
Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark

Kotecha, Ramchandra M.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Arkansas, Dept Elect Engn, Fayetteville, AR 72701 USA Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark

Bahman, Amir Sajjad
论文数: 0 引用数: 0
h-index: 0
机构:
Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark

Iannuzzo, Francesco
论文数: 0 引用数: 0
h-index: 0
机构:
Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark

Mantooth, Homer Alan
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Arkansas, Dept Elect Engn, Fayetteville, AR 72701 USA Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark
[3]
Advanced Accelerated Power Cycling Test for Reliability Investigation of Power Device Modules
[J].
Choi, Ui-Min
;
Jorgensen, Soren
;
Blaabjerg, Frede
.
IEEE TRANSACTIONS ON POWER ELECTRONICS,
2016, 31 (12)
:8371-8386

Choi, Ui-Min
论文数: 0 引用数: 0
h-index: 0
机构:
Aalborg Univ, Dept Energy Technol, Ctr Reliable Power Elect, DK-9100 Aalborg, Denmark Aalborg Univ, Dept Energy Technol, Ctr Reliable Power Elect, DK-9100 Aalborg, Denmark

Jorgensen, Soren
论文数: 0 引用数: 0
h-index: 0
机构:
Grundfos Holding AS, DK-8850 Bjerringbro, Denmark Aalborg Univ, Dept Energy Technol, Ctr Reliable Power Elect, DK-9100 Aalborg, Denmark

Blaabjerg, Frede
论文数: 0 引用数: 0
h-index: 0
机构:
Aalborg Univ, Dept Energy Technol, Ctr Reliable Power Elect, DK-9100 Aalborg, Denmark Aalborg Univ, Dept Energy Technol, Ctr Reliable Power Elect, DK-9100 Aalborg, Denmark
[4]
A SiC Power MOSFET Loss Model Suitable for High-Frequency Applications
[J].
Li, Xuan
;
Jiang, Junning
;
Huang, Alex Q.
;
Guo, Suxuan
;
Deng, Xiaochuan
;
Zhang, Bo
;
She, Xu
.
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS,
2017, 64 (10)
:8268-8276

Li, Xuan
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China

Jiang, Junning
论文数: 0 引用数: 0
h-index: 0
机构:
Texas A&M Univ, College Stn, TX 77840 USA Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China

Huang, Alex Q.
论文数: 0 引用数: 0
h-index: 0
机构:
North Carolina State Univ, FREEDM Syst Ctr, Raleigh, NC 27695 USA Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China

Guo, Suxuan
论文数: 0 引用数: 0
h-index: 0
机构:
North Carolina State Univ, Raleigh, NC 27695 USA Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China

Deng, Xiaochuan
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China

Zhang, Bo
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China

She, Xu
论文数: 0 引用数: 0
h-index: 0
机构:
GE Global Res, Power Elect Lab, Niskayuna, NY 12309 USA Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
[5]
Thermal Loading and Lifetime Estimation for Power Device Considering Mission Profiles in Wind Power Converter
[J].
Ma, Ke
;
Liserre, Marco
;
Blaabjerg, Frede
;
Kerekes, Tamas
.
IEEE TRANSACTIONS ON POWER ELECTRONICS,
2015, 30 (02)
:590-602

Ma, Ke
论文数: 0 引用数: 0
h-index: 0
机构:
Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark

Liserre, Marco
论文数: 0 引用数: 0
h-index: 0
机构:
Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark

Blaabjerg, Frede
论文数: 0 引用数: 0
h-index: 0
机构:
Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark

Kerekes, Tamas
论文数: 0 引用数: 0
h-index: 0
机构:
Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark
[6]
Mission Profile-Based Reliability Design and Real-Time Life Consumption Estimation in Power Electronics
[J].
Musallam, Mahera
;
Yin, Chunyan
;
Bailey, Christopher
;
Johnson, Mark
.
IEEE TRANSACTIONS ON POWER ELECTRONICS,
2015, 30 (05)
:2601-2613

Musallam, Mahera
论文数: 0 引用数: 0
h-index: 0
机构:
Dynex Semicond Ltd, Lincoln LN6 3LF, England Dynex Semicond Ltd, Lincoln LN6 3LF, England

Yin, Chunyan
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Greenwich, London SE10 9LS, England Dynex Semicond Ltd, Lincoln LN6 3LF, England

Bailey, Christopher
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Greenwich, London SE10 9LS, England Dynex Semicond Ltd, Lincoln LN6 3LF, England

论文数: 引用数:
h-index:
机构:
[7]
Electrothermal Cosimulation for Predicting the Power Loss and Temperature of SiC MOSFET Dies Assembled in a Power Module
[J].
Nakamura, Yohei
;
Evans, Tristan M.
;
Kuroda, Naotaka
;
Sakairi, Hiroyuki
;
Nakakohara, Yusuke
;
Otake, Hirotaka
;
Nakahara, Ken
.
IEEE TRANSACTIONS ON POWER ELECTRONICS,
2020, 35 (03)
:2950-2958

Nakamura, Yohei
论文数: 0 引用数: 0
h-index: 0
机构:
ROHM Co Ltd, Kyoto 6150045, Japan ROHM Co Ltd, Kyoto 6150045, Japan

Evans, Tristan M.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Arkansas, Dept Elect Engn, Fayetteville, AR 72701 USA ROHM Co Ltd, Kyoto 6150045, Japan

Kuroda, Naotaka
论文数: 0 引用数: 0
h-index: 0
机构:
ROHM Co Ltd, Kyoto 6150045, Japan ROHM Co Ltd, Kyoto 6150045, Japan

Sakairi, Hiroyuki
论文数: 0 引用数: 0
h-index: 0
机构:
ROHM Co Ltd, Kyoto 6150045, Japan ROHM Co Ltd, Kyoto 6150045, Japan

Nakakohara, Yusuke
论文数: 0 引用数: 0
h-index: 0
机构:
ROHM Co Ltd, Kyoto 6150045, Japan ROHM Co Ltd, Kyoto 6150045, Japan

Otake, Hirotaka
论文数: 0 引用数: 0
h-index: 0
机构:
ROHM Co Ltd, Kyoto 6150045, Japan ROHM Co Ltd, Kyoto 6150045, Japan

Nakahara, Ken
论文数: 0 引用数: 0
h-index: 0
机构:
ROHM Co Ltd, Kyoto 6150045, Japan ROHM Co Ltd, Kyoto 6150045, Japan
[8]
Overview of Real-Time Lifetime Prediction and Extension for SiC Power Converters
[J].
Ni, Ze
;
Lyu, Xiaofeng
;
Yadav, Om Prakash
;
Singh, Brij N.
;
Zheng, Sheng
;
Cao, Dong
.
IEEE TRANSACTIONS ON POWER ELECTRONICS,
2020, 35 (08)
:7765-7794

Ni, Ze
论文数: 0 引用数: 0
h-index: 0
机构:
North Dakota State Univ, ECE Dept, Fargo, ND 58108 USA North Dakota State Univ, ECE Dept, Fargo, ND 58108 USA

Lyu, Xiaofeng
论文数: 0 引用数: 0
h-index: 0
机构:
Navitas Semicond Inc, Los Angeles, CA 90245 USA North Dakota State Univ, ECE Dept, Fargo, ND 58108 USA

Yadav, Om Prakash
论文数: 0 引用数: 0
h-index: 0
机构:
North Dakota State Univ, IME Dept, Fargo, ND 58108 USA North Dakota State Univ, ECE Dept, Fargo, ND 58108 USA

Singh, Brij N.
论文数: 0 引用数: 0
h-index: 0
机构:
John Deere Inc, Fargo, ND 58102 USA North Dakota State Univ, ECE Dept, Fargo, ND 58108 USA

Zheng, Sheng
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Natl Transportat Res Ctr, Knoxville, TN 37932 USA North Dakota State Univ, ECE Dept, Fargo, ND 58108 USA

Cao, Dong
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Dayton, ECE Dept, Dayton, OH 45469 USA North Dakota State Univ, ECE Dept, Fargo, ND 58108 USA
[9]
Accuracy-Enhanced Miller Capacitor Modeling and Switching Performance Prediction for Efficient SiC Design in High-Frequency X-Ray High-Voltage Generators
[J].
Peng, Han
;
Chen, Jimin
;
Cheng, Zhipeng
;
Kang, Yong
;
Wu, Jinglin
;
Chu, Xu
.
IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS,
2020, 8 (01)
:179-194

Peng, Han
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, State Key Lab Adv Electromagnet Engn & Technol AE, Sch Elect & Elect Engn, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, State Key Lab Adv Electromagnet Engn & Technol AE, Sch Elect & Elect Engn, Wuhan 430074, Peoples R China

Chen, Jimin
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, State Key Lab Adv Electromagnet Engn & Technol AE, Sch Elect & Elect Engn, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, State Key Lab Adv Electromagnet Engn & Technol AE, Sch Elect & Elect Engn, Wuhan 430074, Peoples R China

Cheng, Zhipeng
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, State Key Lab Adv Electromagnet Engn & Technol AE, Sch Elect & Elect Engn, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, State Key Lab Adv Electromagnet Engn & Technol AE, Sch Elect & Elect Engn, Wuhan 430074, Peoples R China

Kang, Yong
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, State Key Lab Adv Electromagnet Engn & Technol AE, Sch Elect & Elect Engn, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, State Key Lab Adv Electromagnet Engn & Technol AE, Sch Elect & Elect Engn, Wuhan 430074, Peoples R China

Wu, Jinglin
论文数: 0 引用数: 0
h-index: 0
机构:
United Imaging Healthcare Co Ltd, Shanghai 201807, Peoples R China Huazhong Univ Sci & Technol, State Key Lab Adv Electromagnet Engn & Technol AE, Sch Elect & Elect Engn, Wuhan 430074, Peoples R China

Chu, Xu
论文数: 0 引用数: 0
h-index: 0
机构:
United Imaging Healthcare Co Ltd, Shanghai 201807, Peoples R China Huazhong Univ Sci & Technol, State Key Lab Adv Electromagnet Engn & Technol AE, Sch Elect & Elect Engn, Wuhan 430074, Peoples R China
[10]
Analytical Estimation of Turn ON Switching Loss of SiC MOSFET and Schottky Diode Pair From Datasheet Parameters
[J].
Roy, Shamibrota Kishore
;
Basu, Kaushik
.
IEEE TRANSACTIONS ON POWER ELECTRONICS,
2019, 34 (09)
:9118-9130

Roy, Shamibrota Kishore
论文数: 0 引用数: 0
h-index: 0
机构:
Indian Inst Sci, Dept Elect Engn, Bangalore 560012, Karnataka, India Indian Inst Sci, Dept Elect Engn, Bangalore 560012, Karnataka, India

Basu, Kaushik
论文数: 0 引用数: 0
h-index: 0
机构:
Indian Inst Sci, Dept Elect Engn, Bangalore 560012, Karnataka, India Indian Inst Sci, Dept Elect Engn, Bangalore 560012, Karnataka, India