Smart polymer brushes studied by in situ infrared ellipsometry

被引：0

作者：

Hinrichs, Karsten ^{[1
]}

Furchner, Andreas ^{[1
]}

Kroning, Annika ^{[1
]}

Bittrich, Eva ^{[2
]}

Minko, Sergiy ^{[3
]}

Luzinov, Igor ^{[4
]}

Stamm, Manfred ^{[2
,5
]}

Uhlmann, Petra ^{[2
]}

Eichhorn, Klaus-Jochen ^{[2
]}

机构：

[1] Leibniz Inst Analyt Wissensch ISAS eV, Berlin, Germany

[2] Leibniz Inst Polymer Res Dresden, Dresden, Germany

[3] Univ Georgia, Athens, GA 30602 USA

[4] Clemson Univ, Sch Mat Sci & Engn, Clemson, SC 29634 USA

[5] Tech Univ Dresden, D-01062 Dresden, Germany

来源：

ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2014年 / 248卷

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

465-PMSE

引用

页数：1

共 50 条

[41] In situ infrared ellipsometry study of plasma processing of metallic surfaces [J].

Bertrand, N. ;

Bulkin, P. ;

Drevillon, B. ;

Lucas, S. ;

Benayoun, S. .

Surface and Coatings Technology, 1997, 94-95 (1-3) :362-367

[42] In situ infrared ellipsometry study of plasma processing of metallic surfaces [J].

Bertrand, N ;

Bulkin, P ;

Drevillon, B ;

Lucas, S ;

Benayoun, S .

SURFACE & COATINGS TECHNOLOGY, 1997, 94-5 (1-3) :362-367

[43] Infrared-Nanoscopy of Surface Patterns in Mixed Polymer Brushes [J].

Filimon, Marlena .

BIOPHYSICAL JOURNAL, 2009, 96 (03) :639A-639A

[44] In situ ellipsometry studies on swelling of thin polymer films: A review [J].

Ogieglo, Wojciech ;

Wormeester, Herbert ;

Eichhorn, Klaus-Jochen ;

Wessling, Matthias ;

Benes, Nieck E. .

PROGRESS IN POLYMER SCIENCE, 2015, 42 :42-78

[45] In situ ellipsometry to monitor swelling and dissolution of thin polymer films [J].

Papanu, J.S., 1600, (136)

[46] BIOL 54-Control of protein adsorption on the mixed polymer brushes: Tirf and ellipsometry studies [J].

Hoy, Olha ;

Zdyrko, Bogdan ;

Burtovyy, Ruslan ;

Lupitskyy, Robert ;

Minko, Sergiy ;

Luzinov, Igor .

ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2008, 235

[47] Temperature Dependence of Optical Constants of Silver Film Studied by in situ Spectroscopic Ellipsometry [J].

Rojebuathong, S. ;

Chindaudom, P. ;

Luangtip, W. ;

Horphatum, M. ;

Eiamchai, P. ;

Patthanasetthakul, V. ;

Limsuwan, P. .

SMART MATERIALS, 2008, 55-57 :445-+

[48] Formation of ultrathin films at the solid-liquid interface studied by in situ ellipsometry [J].

Brunner, H ;

Vallant, T ;

Mayer, U ;

Hoffmann, H .

JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1999, 212 (02) :545-552

[49] The electrochemical behaviour of copper in alkaline solutions containing fluoride, studied by in situ ellipsometry [J].

Berlouis, LEA ;

Mamman, DA ;

Azpuru, IG .

SURFACE SCIENCE, 1998, 408 (1-3) :173-181

[50] Multilayers of charged polypeptides as studied by in situ ellipsometry and quartz crystal microbalance with dissipation [J].

Halthur, TJ ;

Elofsson, UM .

LANGMUIR, 2004, 20 (05) :1739-1745

← 1 2 3 4 5 →