STRUCTURAL, OPTICAL AND ELECTRICAL PROPERTIES OF CHEMICAL BATH DEPOSITED CdS THIN FILMS

被引：0
|
作者：
Kathirvel, D. [1 ]
Suriyanarayanan, N. [2 ]
Prabahar, S. [3 ]
Srikanth, S. [3 ]
Rajasekaran, P. [1 ]
机构：
[1] Kalaignar Karunanidhi Inst Technol, Dept Phys, Coimbatore, Tamil Nadu, India
[2] Govt Coll Technol, Dept Phys, Coimbatore, Tamil Nadu, India
[3] Tamilnadu Coll Engn, Dept Phys, Coimbatore, Tamil Nadu, India
来源：
CHALCOGENIDE LETTERS | 2011年 / 8卷 / 12期
关键词：
Electrical resistivity; Structural property; Optical property; Chemical bath deposition; CdS thin films; CADMIUM-SULFIDE; NANOPARTICLES; OPTIMIZATION;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Thin films of CdS of different thickness have been prepared on glass substrates in various temperatures by Chemical bath deposition. The thickness of the deposited film is measured by employing quartz crystal monitor method. The optical properties have been studied. The variation of band gap values of CdS thin film samples were found to be in the range of 2.16 to 2.45 eV. Electrical resistivity measurements were carried out in four-probe vander pavu geometry at room temperature. Resistivity of CdS thin films is about 10(8)Omega cm. The micro structural parameters such as grain size, dislocation density and strain have been evaluated. The lattice parameter values 'a' and 'c' have been determined and is found to be 4.101 angstrom and 6.68 angstrom respectively.
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页码：739 / 745
页数：7
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