t-Tests, F-Tests and Otsu's Methods for Image Thresholding

被引:91
作者
Xue, Jing-Hao [1 ]
Titterington, D. Michael [2 ]
机构
[1] UCL, Dept Stat Sci, London WC1E 6BT, England
[2] Univ Glasgow, Sch Math & Stat, Glasgow G12 8QQ, Lanark, Scotland
关键词
Analysis of variance (ANOVA); F-tests; image thresholding; likelihood-ratio tests; Otsu's methods; Student's t-tests; VARIANCE;
D O I
10.1109/TIP.2011.2114358
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Otsu's binarization method is one of the most popular image-thresholding methods; Student's t-test is one of the most widely-used statistical tests to compare two groups. This paper aims to stress the equivalence between Otsu's binarization method and the search for an optimal threshold that provides the largest absolute Student's t-statistic. It is then naturally demonstrated that the extension of Otsu's binarization method to multi-level thresholding is equivalent to the search for optimal thresholds that provide the largest F-statistic through one-way analysis of variance (ANOVA). Furthermore, general equivalences between some parametric image-thresholding methods and the search for optimal thresholds with the largest likelihood-ratio test statistics are briefly discussed.
引用
收藏
页码:2392 / 2396
页数:5
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